1988
DOI: 10.1016/0368-2048(88)85003-5
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Surface segregation of tetra-N-alkylammonium halides in formamide investigated by angle resolved electron spectroscopy

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Cited by 43 publications
(33 citation statements)
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“…This observation is in line with the report by Holmberg et al. described above who concluded from ARXPS data that the surface excess increases in the order Bu 4 NCl < Bu 4 NBr < Bu 4 NI for these cationic surfactants . Wang et al.…”
Section: Concentration Depth Profilessupporting
confidence: 92%
See 1 more Smart Citation
“…This observation is in line with the report by Holmberg et al. described above who concluded from ARXPS data that the surface excess increases in the order Bu 4 NCl < Bu 4 NBr < Bu 4 NI for these cationic surfactants . Wang et al.…”
Section: Concentration Depth Profilessupporting
confidence: 92%
“…The first quantitative results were reported by the group of Hans Siegbahn, the son of Kai Siegbahn, who won in 1981 the Nobel Prize for Physics for inventing X‐ray photoelectron spectroscopy (XPS) – or Electron Spectroscopy for Chemical Analysis (ESCA) as it was called at that time. His group was the first to apply angle resolved electron spectroscopy for analysing the structure of a surfactant solution . The solutions investigated were tetra‐N‐alkylammonium halide salts ‐ with 1 to 6 C atoms per alkyl chain ‐ in the solvent formamide.…”
Section: Concentration Depth Profilesmentioning
confidence: 99%
“…The cation is the major ion in the first layer, but the anion has a higher fraction in the deeper layers. The distributions of anion and cation are quite different but not identical as assumed in previous references 11, 12, 14. Additionally, the sharply decreasing fraction of cation represented by carbon in the first two layers indicates there might be a preferred orientation for it present on the surface.…”
Section: Resultsmentioning
confidence: 46%
“…With this technique, the fractional concentration‐depth profiles of components near the surface can be reconstructed and the surface structure can be described at molecular level. It has been adopted to investigate the surface structure of ionic surfactant solution for many decades 11–14. In the previous references,11, 12 with ARXPS, the fractional concentration‐depth profiles quaternary ammonium surfactants have been reconstructed as an exponential function, under the assumption that ions with opposite charge have an identical distribution near the surface.…”
Section: Introductionmentioning
confidence: 99%
“…An experiment that allows the segregation profile to be determined in an autonomous way on the basis of microscopic information has been performed for solutions by Siegbahn et al [5][6][7] by means of angular resolved ESCA. As pointed out [5] this method has the potential to yield the segregation profile independently of any assumption about its shape, but the authors state that this attempt requires extremely accurate experimental data.…”
Section: Introductionmentioning
confidence: 99%