2005
DOI: 10.1063/1.1884258
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Surface recombination velocity of silicon wafers by photoluminescence

Abstract: Photoluminescence (PL) and optical reflection measurements, obtained in the two-wavelength SiPHER PL instrument, are used to determine the surface recombination velocity of silicon wafers. Local measurements and contour maps are possible allowing surface recombination maps to be displayed. This instrument also allows doping and trap density measurements. Surface recombination velocities from 10 to 106cm∕s can be measured on low or high resistivity polished and epitaxial wafers.

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Cited by 39 publications
(22 citation statements)
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“…Also, considering that the rear surface is not polished, a value of 6000 cm s −1 for S REAR might be unrealistically low [26]. However, with the extremely low carrier concentration of this substrate, surface states could be bending the band quite strongly, preventing carriers from getting close to the surface and reducing the effective surface recombination velocities even without passivation [27].…”
Section: Discussionmentioning
confidence: 99%
“…Also, considering that the rear surface is not polished, a value of 6000 cm s −1 for S REAR might be unrealistically low [26]. However, with the extremely low carrier concentration of this substrate, surface states could be bending the band quite strongly, preventing carriers from getting close to the surface and reducing the effective surface recombination velocities even without passivation [27].…”
Section: Discussionmentioning
confidence: 99%
“…Note that the photovoltaic efficiency is this electric power output divided by the solar power input = 1000 W/m 2 . As for the surface recombination velocity, we assume that it is equal in n-and p-sides, although it is typically somewhat smaller in the n-side [57]. So, we take = = .…”
Section: Optimal Thickness Of the Photovoltaic Devicementioning
confidence: 99%
“…Noting that, for this given range of surface recombination velocities, this velocity is of more importance in a thinner device than in a thicker one, it is understandable that the photovoltaic efficiency is more affected by the surface recombination velocity at smaller thicknesses. In [57], it is said that the recombination velocity for an unprepared sample is of the order of 10 2 m/s. After passivation of dangling bonds by an HF/H2O, it was lowered to about ~10 m/s [57].…”
Section: Optimal Thickness Of the Photovoltaic Devicementioning
confidence: 99%
“…The knowledge of their variation with thin film deposition conditions would allow us to optimise the fabrication parameters. Photoconductance decay [6], surface photo voltage [7], photoluminescence [8], transient microwave reflectance technique [9] and Thin Solid Films 518 (2010) [1767][1768][1769][1770][1771][1772][1773] quasi steady state photo conductance [10] are widely used for characterizing the minority carrier lifetime and diffusion length. Although the number of methods for evaluating SRV and minority carrier lifetime has been reported, specific environment conditions and complex techniques are required in all these methods, which limit the wide application of these techniques.…”
Section: Introductionmentioning
confidence: 99%