Surface reactions of chlorine molecules and atoms with water and sulfuric acid at low temperatures

Electron-driven chemistry of halogenated compounds in condensed phases: Effects of solvent matrices on reaction dynamics and kinetics

“…During electron irradiation, changes are observed in the F 1s, Cl 2p and C 1s regions. At small electron exposures (<10 15 cm À2 ), the Cl 2p XPS spectral envelope broadens to lower binding energies, consistent with the growth of a new 2p 3/2 /2p 1/2 doublet with a 2p 3/2 peak at %198 eV indicative of the formation of chloride ions in the film [102]. For the corresponding electron exposure in the C 1s region, a new peak appears at %291 eV at the expense of the native CF 2 Cl 2 peak.…”

Cu and Fe chalcopyrite leach activation energies and the effect of added Fe3+

“…This binding energy is greater than that typically associated with SO 2À 4 formed on oxidised chalcopyrite (e.g. 168.5 eV, Harmer et al, 2006) but binding energies in this region have been previously reported for FeSO 4 Á7H 2 O (169.4 eV) and Fe 2 (SO 4 ) 3 (Brion, 1980) and for H 2 SO 4 (169.6 eV, Wren et al, 1979). In the absence of any evidence for differential charging it is unclear what the exact nature of the species is resulting in this peak; however, it is obviously of a highly oxidised S species and is associated with leaching in the presence of added Fe 3+ .…”

Growth and Characterization of Sulfuric Acid under Ultrahigh Vacuum

“…The products were assigned on the basis of their mass spectra. Water was typically detected as H20+ ( d e 18), so3 as the molecular ion so3+ ( d e 80) and fragment ion SOz+ ( d e 64), and H2S04 as H2S04+ ( d e 98).…”