1971
DOI: 10.1007/978-1-4684-1578-0
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Surface Properties of Semiconductors and Dynamics of Ionic Crystals

Abstract: The Russian text was published by Nauka Press in Moscow in 1969 for the Academy of Sciences of the USSR as Volume48 of the Proceedings (Trudy) of the P. N. Lebedev Physics Institute. The present translation is pub-Iished under an agreement with Mezhdunarodnaya Kniga, the Soviet book export agency.

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Cited by 3 publications
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“…At the same time, electrons and holes can recombine at deep-level defects at the AlN/diamond interface. However, not all defects at the interface are involved in the recombination process, only less than 10% or even 0.1% of them act as recombination centers [37,38].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…At the same time, electrons and holes can recombine at deep-level defects at the AlN/diamond interface. However, not all defects at the interface are involved in the recombination process, only less than 10% or even 0.1% of them act as recombination centers [37,38].…”
Section: Resultsmentioning
confidence: 99%
“…At the same time, electrons and holes can recombine at deep-level defects at the AlN/diamond interface. However, not all defects at the interface are involved in the recombination process, only less than 10% or even 0.1% of them act as recombination centers [37,38]. Unlike defects in the bulk of AlN and diamond located near the interface, the interface defects can capture electrons and holes from both semiconductors, which is especially critical for forwardbiased p-n heterojunctions.…”
Section: Resultsmentioning
confidence: 99%