Abstract:This study investigates the effect of chemical mechanical planarization (CMP) processing parameters such as platen velocity, concentration of the oxidizer and abrasive nanoparticle, slurry pH, and surfactant types on the surface roughness of cadmium zinc telluride (CdZnTe) substrate. It was found that these parameters have a significant effect on the quality of the polished surfaces. It was also found that lower platen velocity, lesser abrasive particles concentration, basic slurry pH, and addition of anionic … Show more
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