1998
DOI: 10.1016/s0368-2048(98)00142-x
|View full text |Cite
|
Sign up to set email alerts
|

Surface photovoltage in semiconductors under pulsed optical excitation, and its relevance to synchrotron radiation spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
14
0

Year Published

2007
2007
2020
2020

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 31 publications
(14 citation statements)
references
References 19 publications
0
14
0
Order By: Relevance
“…This charge disequilibrium at the surface explains the unusually long relaxation time for Bi 2.2 Te 3 (excess electrons find no holes to recombine with), as well as its temperature dependence (the bulk mobility of the carriers is lower at 40 K than at 130 K due to impurity scattering). The corresponding transient surface photovoltage 30,31 was measured for the various time delays (Supplementary Figure S3) and found to be negligibly small (≈ 10 meV) for the laser fluences used in this study.…”
Section: Resultsmentioning
confidence: 87%
“…This charge disequilibrium at the surface explains the unusually long relaxation time for Bi 2.2 Te 3 (excess electrons find no holes to recombine with), as well as its temperature dependence (the bulk mobility of the carriers is lower at 40 K than at 130 K due to impurity scattering). The corresponding transient surface photovoltage 30,31 was measured for the various time delays (Supplementary Figure S3) and found to be negligibly small (≈ 10 meV) for the laser fluences used in this study.…”
Section: Resultsmentioning
confidence: 87%
“…However, specific difficulties arise in the interpretation of the data in the case of Si(111)-7×7 that explain the conflicting results of the literature. The surface photovoltage (SPV) effect 45,46 introduces in the low-temperature photoemission spectra an indeterminacy of the E F position of at least several tens of meV. This energy scale is critical for the Si(111)-7×7 surface and makes different datasets compatible with a metallic 16,18,20 or insulating 17 ground state.…”
Section: Introductionmentioning
confidence: 99%
“…In conventional data gathering mode the sample is grounded, and the position as well as the intensity of the peaks are recorded in a static fashion [20]. Although several reports have appeared in the literature related to dynamical XPS measurements in the two extreme ends, very fast (nanoseconds to attoseconds) [21][22][23][24], and very slow (minutes to hours) [25][26][27] through various publications, the basic principles and techniques for implementing such measurements employing very simple modification to conventional instruments [28][29][30][31][32][33][34][35][36][37][38][39].…”
Section: Introductionmentioning
confidence: 99%