2019
DOI: 10.1007/s10854-019-02039-9
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Surface morphology, microstructure and electrical properties of Ca-doped ZnO thin films

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Cited by 25 publications
(11 citation statements)
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“…From transmission electron microscopy (TEM) investigations (Figure a), the ZnO NPs used as seeds for nanowire growth are spherical and monodisperse with an average size of 32 ± 4.7 nm. The crystallinity of the NPs was evaluated through powder X-ray diffraction (PXRD), which shows crystalline reflections for the (100), (002), (101), (102), (110), (103), and (112) planes (Figure S2) in agreement with previously reported values . Scanning electron microscopy (SEM) of the as-grown ZnO NWs shows highly oriented and tightly packed hexagonal wires with a calculated average diameter of 130 ± 28.2 nm (Figure b).…”
Section: Resultssupporting
confidence: 85%
See 1 more Smart Citation
“…From transmission electron microscopy (TEM) investigations (Figure a), the ZnO NPs used as seeds for nanowire growth are spherical and monodisperse with an average size of 32 ± 4.7 nm. The crystallinity of the NPs was evaluated through powder X-ray diffraction (PXRD), which shows crystalline reflections for the (100), (002), (101), (102), (110), (103), and (112) planes (Figure S2) in agreement with previously reported values . Scanning electron microscopy (SEM) of the as-grown ZnO NWs shows highly oriented and tightly packed hexagonal wires with a calculated average diameter of 130 ± 28.2 nm (Figure b).…”
Section: Resultssupporting
confidence: 85%
“…The crystallinity of the NPs was evaluated through powder X-ray diffraction (PXRD), which shows crystalline reflections for the (100), (002), ( 101), ( 102), (110), (103), and (112) planes (Figure S2) in agreement with previously reported values. 46 Scanning electron microscopy (SEM) of the as-grown ZnO NWs shows highly oriented and tightly packed hexagonal wires with a calculated average diameter of 130 ± 28.2 nm (Figure 1b). These wires produce films of an average thickness of 1.3 μm as measured by profilometry.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…The crystallinity of the NPs was evaluated through powder X-ray diffraction (PXRD) which shows crystalline reflections for the (100), (002), (101), (102), (110), (103), and (112) planes (Figure S2) in agreement with previously reported literature values. 48 Scanning electron microscopy (SEM) of the as-grown ZnO NWs shows highly oriented and tightly packed hexagonal wires with a calculated average diameter of 130 ± 28.2 nm (Figure 1b). These wires produce films of an average thickness of 1.3 µm as measured by profilometry.…”
Section: Resultsmentioning
confidence: 99%
“…For example, porous zinc oxide films are known to possess excellent semiconductor properties with wide band gaps (i.e., ~3.37 eV), thereby rendering them suitable for application in gas sensors. More specifically, metal oxide semiconductor-based gas sensors are particularly desirable due to their good stability, superior selectivity, and fast reaction/recovery rates [ 10 , 11 , 12 ]. Porous zinc oxide films are also n-type semiconductor materials and, thus, are suitable for use in solar cells [ 13 ], photocatalysts [ 14 ], varistors, and electrodes.…”
Section: Introductionmentioning
confidence: 99%