2015
DOI: 10.1016/j.jnucmat.2014.11.079
|View full text |Cite
|
Sign up to set email alerts
|

Surface morphology and deuterium retention in tungsten exposed to high flux D plasma at high temperatures

Abstract: a b s t r a c tSurface modifications and deuterium retention induced in tungsten by high fluxes (10 24 m À2 s À1 ) low energy (38 eV) deuterium ions were studied as a function of surface temperature. Blister formation was studied by scanning electron microscopy and electron backscatter diffraction, while deuterium retention was measured by thermal desorption spectroscopy. Blisters are observed on the surface exposed at different temperatures, ranging from 493 K to 1273 K. The blister density and D retention de… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

7
40
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
9

Relationship

1
8

Authors

Journals

citations
Cited by 63 publications
(47 citation statements)
references
References 23 publications
7
40
0
Order By: Relevance
“…The presence of growing bubbles is confirmed by the blisters observed on the surface of the same sample by SEM analysis. In the present experiment as well as in a similar recent experiment [23], blisters, particular to high dose exposure, were observed. The SEM micrograph of the blisters is shown on figure 4 and additional micrographs are attached as on line supplementary material available at (stacks.iop.org/PSTOP/T167/014030/mmedia).…”
Section: Discussion and Conclusive Remarkssupporting
confidence: 87%
“…The presence of growing bubbles is confirmed by the blisters observed on the surface of the same sample by SEM analysis. In the present experiment as well as in a similar recent experiment [23], blisters, particular to high dose exposure, were observed. The SEM micrograph of the blisters is shown on figure 4 and additional micrographs are attached as on line supplementary material available at (stacks.iop.org/PSTOP/T167/014030/mmedia).…”
Section: Discussion and Conclusive Remarkssupporting
confidence: 87%
“…Treating the exponent also as free fit parameter an exponent of 0.62 ± 0.02 and 0.57 ± 0.02 is obtained for the unblistered and blistered case. Fitting the two data sets with a mean exponent of 0.60 ± 0.03, illustrated as green doted line in figure 7 and using equation (15) with an adapted exponent, results in a ratio of 0.76 ± 0.02 between Γ sink and Γ imp . Hence, within the framework of the model, the additional loss flux Γ sink amounts to approximately 80 % of the implanted flux Γ imp .…”
Section: B3 Analytical Hydrogen Retention Modelmentioning
confidence: 99%
“…Under this assumption, one can assign the high temperature TDS peak (usually seen in low flux exposures around 700-900 K) to the release from bubbles [16]. However, the TDS spectra obtained after the high flux exposures, at high temperature (above 600 K) and/or high dose (above 10 26 D/m 2 ), reveal broadening or presence of extra peaks above 900 K [13,17]. These high temperature release stages cannot be simply explained by detrapping from voids with the binding energy of 2.0 eV, while there are no reasons to assume the presence of any stronger traps than voids/cavities.…”
Section: Model Descriptionmentioning
confidence: 99%