2018
DOI: 10.1016/j.surfcoat.2018.07.050
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Surface modification of silicon oxycarbide films produced by remote hydrogen microwave plasma chemical vapour deposition from tetramethyldisiloxane precursor

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Cited by 15 publications
(6 citation statements)
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“…The deposition of a-SiCO:H films was carried out from diethoxymetylsilane, DEMS, (ABCR, Karlsruhe, Germany) precursor using a custom made RPCVD reactor described in detail elsewhere. [38,39] The main chamber, which held the heater stage and substrates, consists of two glassy lids flat flange equipped with center and side inlets (HWS Labortechnik Mainz, Germany). Coating depositions were performed at the flow rate of upstream gas F(H 2 )=100 sccm, the flow rate of the precursor F (DEMS)=5.4±0.1 mg min -1 = 0.91±0.01 sccm and microwave power input P=70 W. This corresponded to a DEMS to hydrogen ratio of 0.0091.…”
Section: Sample Preparationmentioning
confidence: 99%
See 1 more Smart Citation
“…The deposition of a-SiCO:H films was carried out from diethoxymetylsilane, DEMS, (ABCR, Karlsruhe, Germany) precursor using a custom made RPCVD reactor described in detail elsewhere. [38,39] The main chamber, which held the heater stage and substrates, consists of two glassy lids flat flange equipped with center and side inlets (HWS Labortechnik Mainz, Germany). Coating depositions were performed at the flow rate of upstream gas F(H 2 )=100 sccm, the flow rate of the precursor F (DEMS)=5.4±0.1 mg min -1 = 0.91±0.01 sccm and microwave power input P=70 W. This corresponded to a DEMS to hydrogen ratio of 0.0091.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Chemical shifts and structure assignments [40] (putative) of resonances in the 29 energy values of 101.2, 282.6 and 530.5 eV, which correspond to Si 2p, C 1s, and O 1s core levels. The high resolution Si 2p and C 1s spectra, exemplified in Figure 6 for T S =30 and 350 C samples, were fitted with several symmetric Gaussian-Lorentzian (in proportion 70:30) components, according to the literature data referring to a-SiOC:H films produced by various plasma CVD deposition techniques, [25,36,39] and resolving detailed chemical structure. The deconvoluted Si 2p spectra deposited at T S 30 and 350 C (Figure 6a and 6b) are composed of three components with the Si atom linked with either two ((-C-) 2 Si(-O-) 2 ), three ((-C-)Si(-O-) 3 ) and four (Si(-O-) 4 ) oxygen atoms at binding energy of 101.9, 102.6 and 103.6 eV, respectively.…”
Section: T a B L Ementioning
confidence: 99%
“…16, while Table 4 gives the contribution of particular components of each spectrum. For the non-modified MWCNTs, the C 1s spectrum is comprised of bands typical for carbon materials [18,[39][40][41][42]. The highest intensity is shown by the maximum at 284.6 eV corresponding to C=C (sp 2 ) bonds.…”
Section: Activated Filler Modification With Silane Derivativesmentioning
confidence: 99%
“…The second band at 103.1 eV is associated with Si atoms bonded to four adjacent oxygen atoms (Si(-O-) 4 ), and the last band at 100.9 eV comes from silicon bonded to three carbon atoms and one oxygen atom, denoted as (-C-) 3 Si(-O-). In the case of the pp-HMDSO layer (Figure 7), all three bands correspond to silicon oxycarbide species [53]. The band centered at 101.1 eV is related to (-C-) 3 Si(-O-).…”
Section: Molecular Structurementioning
confidence: 97%