2012
DOI: 10.3788/hplpb20122410.2296
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Surface measurement and evaluation of large-aperture continuous phase plates

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“…The surface shape residual error is generally not more than tens of nanometers [8,9]. Therefore, how to use chemical processing technology to achieve high damage threshold and ensure the surface accuracy of the element is the key to whether the chemical processing process of the phase element can be realized [10][11][12]. Through the change of the parameters of the fused silica sample during the chemical treatment process, such as the control of the etching depth, and the process verification and strict control measures in the cleaning process [12][13][14], the surface accuracy of the component is guaranteed to be slightly changed while the damage threshold of the phase component is increased.…”
Section: Introductionmentioning
confidence: 99%
“…The surface shape residual error is generally not more than tens of nanometers [8,9]. Therefore, how to use chemical processing technology to achieve high damage threshold and ensure the surface accuracy of the element is the key to whether the chemical processing process of the phase element can be realized [10][11][12]. Through the change of the parameters of the fused silica sample during the chemical treatment process, such as the control of the etching depth, and the process verification and strict control measures in the cleaning process [12][13][14], the surface accuracy of the component is guaranteed to be slightly changed while the damage threshold of the phase component is increased.…”
Section: Introductionmentioning
confidence: 99%