2016
DOI: 10.1016/j.elspec.2015.12.007
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Surface magnetism of NiO investigated by magnetic spectromicroscopies

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Cited by 5 publications
(1 citation statement)
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“…For the last few decades, soft x-ray magnetic linear dichroism (XMLD) [20] with its elemental specificity and surface sensitivity has become the method of choice for the study of AFM material surfaces and interfaces [21][22][23]. Even though only a few AFM-AFM material systems have been explored so far in the literature, the XMLD method was only used for the study of the CoO-NiO bilayer system [24,25], exploring the magnetic coupling and spin reorientation transition with NiO film thickness.…”
Section: Introductionmentioning
confidence: 99%
“…For the last few decades, soft x-ray magnetic linear dichroism (XMLD) [20] with its elemental specificity and surface sensitivity has become the method of choice for the study of AFM material surfaces and interfaces [21][22][23]. Even though only a few AFM-AFM material systems have been explored so far in the literature, the XMLD method was only used for the study of the CoO-NiO bilayer system [24,25], exploring the magnetic coupling and spin reorientation transition with NiO film thickness.…”
Section: Introductionmentioning
confidence: 99%