1992
DOI: 10.1016/0038-1098(92)90387-o
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Surface degradation of YBa2Cu3O7−δ observed by means of contact resistance measurement

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Cited by 18 publications
(13 citation statements)
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“…The observed decrease of the surface conductivity over time is in agreement also with works done on YBCO/metal contacts [5]. Effects shown in Fig.…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…The observed decrease of the surface conductivity over time is in agreement also with works done on YBCO/metal contacts [5]. Effects shown in Fig.…”
Section: Resultssupporting
confidence: 91%
“…Relatively low activation energy for the oxygen diffusion in the YBCO, which has been shown by various experiments to be in range from ~0.5 to ~1.3 eV within the material and about ~1.7 eV for out-diffusion from the surface [2][3][4][5], leads to leakage of the oxygen out of the YBCO surface and spontaneous creation of a degraded insulating near-surface layer with decreased amount of oxygen content [5][6][7]. This is a big challenge in many applications where well defined and sharp interfaces between HTS and electrodes are required.…”
Section: Introductionmentioning
confidence: 99%
“…As was shown in Ref. 18, the degradation processes near the HTS interface are diffusion-like and the oxygen concentration gradually decreases from the bulk to the HTS surface where a depleted layer is formed. It is in the disordered state because of the disordered oxygen vacancies and will be modeled further as a nonsuperconducting N' layer with variing width 1 along the contact (see the right part of Fig.…”
Section: Zero Bias Anomaliessupporting
confidence: 57%
“…1 an increase in point contact resistance immediately after preparation is shown. This change was explained in the term of out-diffusion of oxygen from surface layer of HTS near HTS/metal interface caused by lower activation energy of oxygen on the surface [15]. On the base of our results we assume the lowering of the surface barrier for out-diffusion of oxygen from HTS due to Schottky effect.…”
Section: Degradation Processes In the Surface Layermentioning
confidence: 50%
“…±0.5 V -±2 V. This effect we explained by rapid changes of oxygen concentration in HTS near HTS/metal interface caused by the electric field or/and electromigration. The changes of oxygen content directly yield a change of resistivity in HTS near the interface [15,17,18].…”
Section: Degradation Processes In the Surface Layermentioning
confidence: 99%