2015
DOI: 10.5545/sv-jme.2014.1644
|View full text |Cite
|
Sign up to set email alerts
|

Surface Defect Detection on Optical Devices Based on Microscopic Dark-Field Scattering Imaging

Abstract: Configuring new machine tools is a complex task that involves the use of a large range of conceptions, methods, models, virtual prototypes and simulations. This paper presents a methodology for configuring a new machine tool to the level of a virtual prototype by using CAD configurator Pro/WEB.Link and a top-down approach. This methodology is explained via an example of the development of a mini-laboratory and desktop 3-axis parallel kinematic milling machine (PKMM). The results are two variants of the virtual… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 32 publications
0
1
0
Order By: Relevance
“…The analysis in the automobile industry [5,6]. Among these systems, there are those using an image, such as fringe projection systems, dark field scattering [7] or retro reflection-based systems. Fringe projection systems consist on projecting parallel fringes or regular patterns on the surface of an object, and taking measurements of the deformation of the lines or patterns, or measurements of the phase shift produced by the surface in the pattern signal, when using interferometry.…”
Section: Description Of the Image Acquisition Systemmentioning
confidence: 99%
“…The analysis in the automobile industry [5,6]. Among these systems, there are those using an image, such as fringe projection systems, dark field scattering [7] or retro reflection-based systems. Fringe projection systems consist on projecting parallel fringes or regular patterns on the surface of an object, and taking measurements of the deformation of the lines or patterns, or measurements of the phase shift produced by the surface in the pattern signal, when using interferometry.…”
Section: Description Of the Image Acquisition Systemmentioning
confidence: 99%