Wide-angle
soft X-ray scattering on free silica particles of different
porosity prepared in a beam is reported. The explored q region is mostly dominated by features due to surface roughness
and bulk porosity. A comprehensive experimental and theoretical analysis
of silica particles of different porosity is presented for various
incident photon energies. A correlation analysis, based on the theory
of Porod, is used to test the validity of exact Mie theory in different
pore density limits. The ability of the discrete dipole scattering
model (DDSCAT) to resolve local effects, caused by various pore distributions,
is discussed. Characteristic differences between the soft X-ray scattering
patterns of the particle samples of different surface properties and
porosity are detected. For all mentioned cases, it was confirmed that
the effective radius concept of the Guinier model can be successfully
extended to Mie theory and DDSCAT in describing the additive contributions
of the primary particles, including a thin inhomogeneous solvent-rich
surface shell and empty bulk pores. Close agreement, within ±15%,
between the calculated and observed pore sizes and porosity values
is reached. The influence of pores is alternatively described either
in terms of secondary Mie scattering, which is modulated by the local
internal electrical field within the particles, or by an independent
Mie scattering process induced by the incident field on isolated pores.
It is found that for the typical pore/particle size ratios the latter
approach presents the best choice.