2021
DOI: 10.1016/j.apsusc.2021.150930
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Surface chemical treatment effect on (1 1 1) PbSnTe < In > Topological crystalline insulator films

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Cited by 8 publications
(7 citation statements)
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“…Although the photoemission intensity at the 280–290 eV binding energies is mainly due to the Se LMM Auger peak, the carbon C 1s photoemission line is observable at all of the points. The C 1s binding energy in the points p1 and p2 is close to the 284.6 eV and can be related to the photoemission from the graphene film at the BS/G/SiO 2 interface, or probably, graphene plates washed away from the substrate and redeposited onto the BS film surface during the treatment in HCl-iPA (Figure ).…”
Section: Resultsmentioning
confidence: 77%
See 1 more Smart Citation
“…Although the photoemission intensity at the 280–290 eV binding energies is mainly due to the Se LMM Auger peak, the carbon C 1s photoemission line is observable at all of the points. The C 1s binding energy in the points p1 and p2 is close to the 284.6 eV and can be related to the photoemission from the graphene film at the BS/G/SiO 2 interface, or probably, graphene plates washed away from the substrate and redeposited onto the BS film surface during the treatment in HCl-iPA (Figure ).…”
Section: Resultsmentioning
confidence: 77%
“…The (0001) surface of the Bi 2 Se 3 single crystal was prepared by cleaving the crystal with adhesive tape in the XPS system load-lock chamber at a pressure of <5 × 10 –7 mbar. The surface of BS/G structures was prepared by chemical treatment in isopropanol saturated with hydrochloric acid vapors (HCl-iPA) using the procedure described in refs , for A3B5 compounds and recently reported to be effective also for Pb 1– x Sn x Te: (i) treatment of the sample in HCl-iPA solution for 10 s with stirring; (ii) rinsing the sample in pure isopropanol for 30 s with stirring; (iii) immediately drying the sample by pumping down in the XPS system load-lock chamber; and (iv) annealing for 20 min at 170 °C in the XPS system preparation chamber at a pressure of <5 × 10 –10 mbar.…”
Section: Preparation Of Samples and Methods Of Characterizationmentioning
confidence: 99%
“…The stoichiometric ratios of Bi, Sb, Te, and Se at the sample surface were calculated using the Bi 5d, Sb 4d, Te 4d, and Se 3d XPS peak areas, Scofield’s photoionization cross-sections, and TPP-2M inelastic mean free path values, accounting for photoemission asymmetry factors . To obtain an atomically clean and structurally ordered film surface for studying the electronic structure by ARPES, the samples were additionally prepared according to the procedure described in and consisted of four steps: (1) treatment in isopropanol (iPA) saturated with HCl vapor for 10 s; (2) washing in pure iPA for 30 s; (3) drying during pre-pumping in the photoemission system loadlock chamber; and (4) annealing in ultra-high vacuum (<5 × 10 –10 mbar) at 210 °C for 20 min.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Таким образом, химическая обработка плёнок Pb 1-x Sn x Te (111) в растворе HCl-iPA удаляет с поверхности собственные оксиды и загрязнения и обогащает поверхность элементным теллуром. Дальнейший прогрев в вакууме приводит к десорбции элементного теллура, обогащению поверхности оловом и образованию атомарно-чистой и структурно-упорядоченной поверхности Pb 1-x Sn x Te (111)-(1×1), пригодной для дальнейшего научного или промышленного использования [7].…”
Section: оптический детектор спина свободных электронов на основе пол...unclassified