2019
DOI: 10.1016/j.ijrmhm.2019.02.017
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Surface chemical modification of CVD diamond films by laser irradiation

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Cited by 15 publications
(4 citation statements)
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“…In the C 1s XPS of PZC-0 derived carbon, the peak centered at 283.68 eV is ascribed to C-C and C=C groups [23]. The C 1s XPS of PZC-x (x = 1, 2, 3) derived ceramics shows a dominating component positioned at around 284 eV, corresponding to the C=C and C-C groups, which is the energy of C 1s core level in the carbon species of aromatic ring [24,25]. The shift of the peak position implies the potential interaction between zirconium and the carbon phase, as confirmed by the presence of Zr-C bond.…”
Section: Xps Analysis Of Pzc-derived Carbonsmentioning
confidence: 99%
“…In the C 1s XPS of PZC-0 derived carbon, the peak centered at 283.68 eV is ascribed to C-C and C=C groups [23]. The C 1s XPS of PZC-x (x = 1, 2, 3) derived ceramics shows a dominating component positioned at around 284 eV, corresponding to the C=C and C-C groups, which is the energy of C 1s core level in the carbon species of aromatic ring [24,25]. The shift of the peak position implies the potential interaction between zirconium and the carbon phase, as confirmed by the presence of Zr-C bond.…”
Section: Xps Analysis Of Pzc-derived Carbonsmentioning
confidence: 99%
“…The SEM with a spatial resolution of sub-50 nm generates the image of a sample by detecting the reflected electrons focusing only on the surface. The SEM provides a relatively simple, relatively quick and a less costly method to study samples with diverse geometries [108,132,134]. However, an application of SEM to diamond batch processing is limited as the measurements require a compensation for a non-conducting (i.e., diamond) sample charge accumulation [135].…”
Section: Characterisation Of Micromachined Diamond Samplesmentioning
confidence: 99%
“…The X-ray analytical techniques, such as X-ray photoelectron spectroscopy (XPS) [49,145,146] also known as electron spectroscopy for chemical analysis (ESCA) and X-ray powder diffraction (XRD) [134] are capable of providing precise qualitative and quantitative information about the composition and structure of diamond samples. High resolution XPS/ESCA measurements are able to yield a valuable information concerning the chemical composition at the uppermost surface and/or subsurface areas (down to a few hundred of nanometres), the information about the abundance of the sp 2 and sp 3 fractions, and their relative phase ratios and, a precise information about the DOS from valence band edge regions [147].…”
Section: Characterisation Of Micromachined Diamond Samplesmentioning
confidence: 99%
“…In this process, a chemical precursor is vaporized and then deposited onto a substrate, where it reacts with the surface to form a thin film coating. CVD can be used to create a variety of coatings, including those that are resistant to wear, corrosion, or heat [13].…”
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confidence: 99%