1998
DOI: 10.1016/s0168-9002(98)00552-x
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Surface charge limit in NEA superlattice photocathodes of polarized electron source

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Cited by 66 publications
(12 citation statements)
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“…The structures are p-doped using a high-gradient doping technique, consisting of a thin (10 nm), very highly doped (5 × 10 19 cm −3 ) surface layer with a lower density doping (5 × 10 17 cm −3 ) in the remaining active layer(s). A high-surface doping density is necessary to achieve high QE while reducing the surface-charge-limit problem [66,67]. A lower doping density is used to maximize the polarization [68].…”
Section: Beam Parametersmentioning
confidence: 99%
“…The structures are p-doped using a high-gradient doping technique, consisting of a thin (10 nm), very highly doped (5 × 10 19 cm −3 ) surface layer with a lower density doping (5 × 10 17 cm −3 ) in the remaining active layer(s). A high-surface doping density is necessary to achieve high QE while reducing the surface-charge-limit problem [66,67]. A lower doping density is used to maximize the polarization [68].…”
Section: Beam Parametersmentioning
confidence: 99%
“…The results of photoelectron emission experiments were used to elucidate (1) and (2), which led to a comparison of diamond PN and PIN junction diode electron emitters with NEA. Results of research on deep ultraviolet-light emitting diodes with diamond PIN junctions was introduced to develop a new structural scheme (3) to overcome the low carrier density at room temperature that results from the deep donor/acceptor levels of diamond, which have never previously been considered in conventional semiconductors.…”
Section: Resultsmentioning
confidence: 99%
“…The effective NEA devices have been well developed as photocathodes in high energy accelerator research fields [3]. GaAs/GaAsP super-lattice with effective NEA photocathodes were also developed for spin-polarized electron source applications [4].…”
mentioning
confidence: 99%
“…Preparation of an NEA surface is carried out by alternately depositing cesium and oxygen (Yo-Yo technique) [9].…”
Section: B Measurement System and Nea Preparationmentioning
confidence: 99%