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2010
DOI: 10.1016/j.susc.2009.12.023
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Surface characterization of imidazolium ionic liquids by high-resolution Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy

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Cited by 64 publications
(67 citation statements)
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“…Furthermore, the quantum-chemically calculated pDOS provides invaluable information for analysis and interpretation of MIES spectra. For the increasing surface sensitivity from XPS over UPS to MIES, our quantum-chemically supported technique of reconstruction and analysis provides us information about the chemical composition and steric structure of ionic liquid surfaces, in full agreement with previously suggested surface structures of [EMIm]Tf 2 N and [OMIm]Tf 2 N. 6,25,26,[35][36][37] …”
Section: Discussionsupporting
confidence: 84%
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“…Furthermore, the quantum-chemically calculated pDOS provides invaluable information for analysis and interpretation of MIES spectra. For the increasing surface sensitivity from XPS over UPS to MIES, our quantum-chemically supported technique of reconstruction and analysis provides us information about the chemical composition and steric structure of ionic liquid surfaces, in full agreement with previously suggested surface structures of [EMIm]Tf 2 N and [OMIm]Tf 2 N. 6,25,26,[35][36][37] …”
Section: Discussionsupporting
confidence: 84%
“…Again a shift of 1.1 eV between the cation and the anion is necessary to fit the expected alkylchain contribution to the lower binding energy edge of the difference spectrum. Due to the very high surface sensitivity of MIES this feature of the difference spectrum means that the octyl-chains of the [OMIm] + cations are present at the outermost part of the surface-a result that agrees well with our UPS (He II) reconstruction and the results from angle resolved XPS, 25,26 HRBS, 35,36 and SFG. 6,37 Note that the experimental MIES spectra have been normalized to 12.5 eV, and this may influence the obtained difference spectrum.…”
Section: Ups Spectrasupporting
confidence: 85%
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“…Many established UHV-based surface science techniques have successfully contributed to an increasingly detailed understanding not only of the IL/ vacuum interface, but also of IL bulk properties. The applied methods include X-ray photoelectron spectroscopy (XPS) [106,107,, UV photoelectron spectroscopy [138,139,165,166], inverse photoelectron spectroscopy (IPES) [165,166], X-ray absorption spectroscopy (NEXAFS) [165], soft X-ray emission spectroscopy (SXES) [166], low energy ion scattering (LEIS) [141], metastable ion spectroscopy (MIES) [138,139], time-offlight secondary mass spectroscopy (TOF-SIMS) [140], Rutherford backscattering [167][168][169][170][171], high resolution electron energy loss spectroscopy (HREELS) [138], reflection absorption infrared spectroscopy (RAIRS) [172][173][174][175], direct recoil spectroscopy (DRS) [176], and scanning tunneling microscopy [177][178][179][180][181], to name only a few. In addition, an increasing number of theoretical studies and simulations have been conducted [101,[182][183][184][185][186][187][188][189][190].…”
Section: Molecular Insights Into Il/gas and Il/support Interfacesmentioning
confidence: 99%
“…For conventional RBS measurements (E 0 = 1-2 MeV), depth resolution of 10-20 nm can be achieved depending on the projectiles and target materials. By optimizing energy resolution of the detector-analyzer system, the depth resolution can reach the level of sub-nanometer, which is beneficial for precise thickness analysis of thin films [15,16]. RBS spectra are analyzed by standard ion beam analysis codes of SIMNRA [17] or DataFurnace [18].…”
Section: Introductionmentioning
confidence: 99%