1995
DOI: 10.1016/0008-6223(94)00144-o
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Surface characterization of carbon fibers using angle-resolved XPS and ISS

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Cited by 432 publications
(279 citation statements)
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“…3, all samples have similar densities of state (DOS) near the Fermi level (E F ) as indicated by the overlay of the spectra in the inset. However, MFG-P does have a more pronounced O 2s band at 21.9 eV, suggesting that this graphite moiety is covered with larger amounts of surface carbonyl groups as stated in other studies [23][24][25]. This observation is further supported by the broadening of MFG-P's C 1s spectrum towards higher binding energies shown in Fig.…”
Section: Resultssupporting
confidence: 82%
“…3, all samples have similar densities of state (DOS) near the Fermi level (E F ) as indicated by the overlay of the spectra in the inset. However, MFG-P does have a more pronounced O 2s band at 21.9 eV, suggesting that this graphite moiety is covered with larger amounts of surface carbonyl groups as stated in other studies [23][24][25]. This observation is further supported by the broadening of MFG-P's C 1s spectrum towards higher binding energies shown in Fig.…”
Section: Resultssupporting
confidence: 82%
“…The results showed Ti and O binding (530.2 eV) and C and O binding (531.7 eV). 21,22) The C and O binding was considered to be surface impurities, and the Ti and O binding could be identified as titanium oxide through an analysis of the thin boundary interface between particles as shown in Fig. 8.…”
Section: Resultsmentioning
confidence: 99%
“…Consequently, the oxygen (1s) peak shown in Figure 10 was considered as Si-related oxides rather than TiAO components. Sputtering for 60 s completely eliminates the peak of Si-related oxides (530.8 eV) that the new deconvolution results, believed to be TiAO 36,38,39 and C¼ ¼O, were obtained at 530.0 and 532.0 eV, respectively.…”
Section: Xpsmentioning
confidence: 95%