Surface and interface analysis in polymer technology: A review

Holm, Ragnar; Storp, S.

doi:10.1002/sia.740020305

Cited by 58 publications

(16 citation statements)

References 23 publications

(4 reference statements)

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“…In the repeat unit of PEEK this ratio is 6.33. This agreement is good in that C:O ratios measured by XPS frequently differ from calculated values [16] and quantitative accuracy of the analysis of polymer surfaces is generally in the region 15-20%. The presence of residual degreasing solvent was considered unlikely because of the reported resistance of PEEK to acetone [17].…”

Section: Untreated Surfacesmentioning

confidence: 57%

The surface treatment and adhesive bonding of polyetheretherketone. Part II. Surface characterization

Evans

Bulpett

Ghezel

1987

Journal of Adhesion Science and Technology

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Section: Untreated Surfacesmentioning

confidence: 57%

The surface treatment and adhesive bonding of polyetheretherketone. Part II. Surface characterization

Evans

Bulpett

Ghezel

1987

Journal of Adhesion Science and Technology

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“…Although each Cls peak was somewhat broad, which may have been due to locally different charging, the C1~ peak shape analysis could be easily carried out. In general, XPS measurement can yield information for a polymer sample to a depth of 50-100 A [16,17]. The peak shape analysis indicated that Ca:cb:c c was 3.…”

Section: Oh Imentioning

confidence: 99%

XPS analysis (ESCA) of the surface composition of poly(styrene/2-hydroxyethyl methacrylate) microspheres produced by emulsifier-free emulsion polymerization

Okubo¹,

Yamamoto²,

Kamei³

1989

Colloid & Polymer Sci

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Polymer microspheres composed of various compositions of styrene and 2hydroxyethyl methacrylate (HEMA) were produced by batch emulsifier-free emulsion polymerization. The HEMA content at the surface, [I-IEMA] s , of the microspheres powdered by freeze-drying was determined by both quantitative Cl,/Ois analysis and Cls peak shape analysis of the x-ray photoelectron spectroscopic spectra. When the HEMA content in the microsphere, [HEMA]p, was less than about 5 mole 0/0, the [HEMA]s values determined by the two different methods showed good agreement. At [HEMA]p above 5 mole %, [HEMA] ~ values determined by the first method were about 15 mole % greater than those determined by the second. They both showed a similar tendency with the [HEMA], being higher than the [HEMA]p, e.g., when [HEMA]p was 1 mole0/0, [HEMA], was 11 mole %. The intensity of the satellite peak due to the z ~ ~* transition of the benzene ring of the styrene component decreased with an increase in [HEMA]p, to zero at 5 mole 0/0 of [HEMA]p. These results indicate that the HEMA component is localized at the surface.

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“…An excellent introduction to the common features observed in electron spectra of non metallic surfaces and a simple discussion of the physical processes giving rise to these features is included in the review article by Holm and Storp (7).…”

Section: Introduction To Core Electron Spectra Of Polymeric Materialsmentioning

confidence: 99%

Surface Analysis of Fibers and Polymers by X-Ray Photoelectron Spectroscopy: Industrial Applications

Millard

1982

ACS Symposium Series

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Applications of surface analysis by X-ray photoelectron spectroscopy (XPS) are reviewed, emphasizing analysis of chemically modified fibers and polymers. The review is restricted to materials science applications involving non--metal-metal oxide systems. Results from the surface modification of fibers by low temperature plasmas, including oxidation treatments and application of coatings by deposition and plasma grafting, are reviewed. Examples emphasizing the ability of XPS to obtain results on non-uniform solids encountered in typical materials science applications, such as chemically modified polymer beads and granules, o-ring seals, wood and various intractable polymers, are presented. Recent results from the determination of inelastic mean free path lengths in organic solids are reviewed.In this review the term X-ray photoelectron spectroscopy (XPS) will be used rather than the term adapted by Sieghahn, namely electron spectroscopy for chemical analysis (ESCA), to describe the surface sensitive electron spectroscopy under discussion. The fact that this symposium is taking place on the topic of industrial applications of surface analysis reflects the growth of the application of different areas of surface sciences in practical industrial and technological materials science areas. Initially, scientists working in XPS were concerned with establishing the fundamentals of the physics associated with the processes involved in the This chapter not subject to U.S.

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Surface and interface analysis in polymer technology: A review

Cited by 58 publications

References 23 publications

The surface treatment and adhesive bonding of polyetheretherketone. Part II. Surface characterization

The surface treatment and adhesive bonding of polyetheretherketone. Part II. Surface characterization

XPS analysis (ESCA) of the surface composition of poly(styrene/2-hydroxyethyl methacrylate) microspheres produced by emulsifier-free emulsion polymerization

Surface Analysis of Fibers and Polymers by X-Ray Photoelectron Spectroscopy: Industrial Applications

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