2022
DOI: 10.3390/bioengineering9120760
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Surface Accumulation of Cerium, Self-Assembling Peptide, and Fluoride on Sound Bovine Enamel

Abstract: The accumulation of caries-preventive compounds on sound enamel is crucial in order to improve the inhibition of carious lesion initiation. The aim of this research was to investigate the initial accumulation of cerium, oligopeptide p11-4, and fluoride from NaF or amine fluoride (AmF) on sound enamel in vitro by means of energy dispersive X-ray spectroscopy (EDX). Polished bovine enamel specimens (n = 120 from 60 teeth) were fabricated. Out of these, 12 specimens each were treated with CeCl3 (cerium(III) chlor… Show more

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“…Using EDX, it was possible to determine specific fields on each specimen without processing the specimens into particles. In low vacuum mode (LV), the specimens could be measured directly after preparation without extensive exsiccation, as additional drying and sputtering were not necessary [ 23 , 28 ]. Due to the water vapor in the chamber, fewer exsiccation artifacts are expected, but a loss of resolution due to deflection of the electron beam by gas atoms in the SEM chamber ( skirt effect ) is also to be expected [ 23 , 29 ].…”
Section: Discussionmentioning
confidence: 99%
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“…Using EDX, it was possible to determine specific fields on each specimen without processing the specimens into particles. In low vacuum mode (LV), the specimens could be measured directly after preparation without extensive exsiccation, as additional drying and sputtering were not necessary [ 23 , 28 ]. Due to the water vapor in the chamber, fewer exsiccation artifacts are expected, but a loss of resolution due to deflection of the electron beam by gas atoms in the SEM chamber ( skirt effect ) is also to be expected [ 23 , 29 ].…”
Section: Discussionmentioning
confidence: 99%
“…In low vacuum mode (LV), the specimens could be measured directly after preparation without extensive exsiccation, as additional drying and sputtering were not necessary [ 23 , 28 ]. Due to the water vapor in the chamber, fewer exsiccation artifacts are expected, but a loss of resolution due to deflection of the electron beam by gas atoms in the SEM chamber ( skirt effect ) is also to be expected [ 23 , 29 ]. To reduce this skirt effect described for LV-EDX analyses, all our measurements were carried out using a pressure limiting aperture (PLA), which shortens the path of the electron beam through the chamber gas [ 30 ].…”
Section: Discussionmentioning
confidence: 99%
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