2011 IEEE International Ultrasonics Symposium 2011
DOI: 10.1109/ultsym.2011.0131
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Suppression mechanism of transverse-mode spurious responses in SAW resonators on a SiO<inf>2</inf>/Al/LiNbO<inf>3</inf> structure

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Cited by 6 publications
(2 citation statements)
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“…11d. The alleviation of this effect would require the use of SAW devices with improved spurious-mode behaviour, either by partially suppressing the spurious modes or by separating them more from the main resonance as suggested in [23,24]. However, their technology is not yet mature enough to reach commercialisation.…”
Section: Prototypementioning
confidence: 99%
“…11d. The alleviation of this effect would require the use of SAW devices with improved spurious-mode behaviour, either by partially suppressing the spurious modes or by separating them more from the main resonance as suggested in [23,24]. However, their technology is not yet mature enough to reach commercialisation.…”
Section: Prototypementioning
confidence: 99%
“…There are also previous research studies that investigated the effect of the deposited shape of the SiO 2 film on SAW device characteristics. [14][15][16][17][18][19] The reason why research studies on the SiO 2 film have been actively conducted is that the SiO 2 film has TCF whereby positive and negative are different from those of the substrate materials. Therefore, when it is necessary to improve the TCF of the SAW devices, the SiO 2 film for passivation is better than the Si 3 N 4 film, which has the same sign of TCF as the substrate materials.…”
Section: Introductionmentioning
confidence: 99%