Supporting Early-Safety Analysis of IoT Systems by Exploiting Testing Techniques

Clerissi, Diego; Di Rocco, Juri; Di Ruscio, Davide; Di Sipio, Claudio; Ihirwe, Felicien; Mariani, Leonardo; Micucci, Daniela; Rossi, Maria Teresa; Rubei, Riccardo

doi:10.1109/models-c59198.2023.00089

2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems Companion (MODELS-C) 2023

DOI: 10.1109/models-c59198.2023.00089

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Supporting Early-Safety Analysis of IoT Systems by Exploiting Testing Techniques

Diego Clerissi,

Juri Di Rocco,

Davide Di Ruscio

et al.

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Supporting Early-Safety Analysis of IoT Systems by Exploiting Testing Techniques

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