“…This paper extends the formulation of a very important class of recently developed classifiers called Extreme Learning Machines (ELMs) to complex valued problems [15,16]. The motivation for the proposed extension stems from the fact that the real valued ELM has shown some of the lowest training errors among machine learning algorithms and in particular support vector machines classifiers (SVMs) [5,[20][21][22]. By extending ELMs to complex inputs, their applications domain can dramatically increase, encompassing all types of research associated to the study of the interaction of matter with waves, and in particular spectroscopy (acoustic, dielectric, optical, terahertz, infrared, electron-spin resonance, nuclear magnetic or paramagnetic resonance, etc.)…”