2019
DOI: 10.1007/978-3-030-13709-0_21
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Supervised Learning Approach for Surface-Mount Device Production

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Cited by 11 publications
(5 citation statements)
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“…This work is based on a dual-level defect detection method. In (Jabbar et al, 2018) some treebased machine learning methods are used to predict the defects found in AOI using SPI data. (Gaffet, Ribot, Chanthery, Roa, & Merle, 2021) proposes an unsupervised univariate method for monitoring the In-Circuit Testing machine (located at the end of the Surface Mount Technology lines) and components.…”
Section: Related Workmentioning
confidence: 99%
“…This work is based on a dual-level defect detection method. In (Jabbar et al, 2018) some treebased machine learning methods are used to predict the defects found in AOI using SPI data. (Gaffet, Ribot, Chanthery, Roa, & Merle, 2021) proposes an unsupervised univariate method for monitoring the In-Circuit Testing machine (located at the end of the Surface Mount Technology lines) and components.…”
Section: Related Workmentioning
confidence: 99%
“…According to the authors, XGBoost models were shown to be capable of capturing complex nonlinear characteristics of the sensor data and dealing with anomalies in the data set. Jabbar et al [18] proposed a decision-making tool based on XGBoost to support operators in the manufacturing of printed circuit boards. XGBoost was shown to yield both high accuracy and high recall in the classification of defects when trained on real-world data.…”
Section: Related Workmentioning
confidence: 99%
“…Indirectly supervised learning approaches enhance the outcome of current automatic optical inspections and measured solder joint dimensions. This can be used in the production line to support the operator in assessing defect calls from the automatic optical inspection and identify false positive classifications (Jabbar et al, 2019). Specifically, Jabbar et al compared tree-based machine learning algorithms for this use case and achieved a good performance (Jabbar et al, 2019).…”
Section: Introductionmentioning
confidence: 99%
“…This can be used in the production line to support the operator in assessing defect calls from the automatic optical inspection and identify false positive classifications (Jabbar et al, 2019). Specifically, Jabbar et al compared tree-based machine learning algorithms for this use case and achieved a good performance (Jabbar et al, 2019). Supervised deep learning has also been applied to real production environment data to enhance the outcome of the optical inspections and reduce labor cost (Chang, Wei, Chen, & Hsieh, 2018).…”
Section: Introductionmentioning
confidence: 99%