Superfast 3D absolute shape measurement using five binary patterns

Hyun, Jae-Sang; Zhang, Song

doi:10.1016/j.optlaseng.2016.10.017

Cited by 64 publications

(14 citation statements)

References 20 publications

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“…[24] introduced special markers and speckles to the patterns to indicate fringe indexes. Hyun and Zhang [25] used five patterns, where three carry phase and the other two carry the fringe order. Jiang and Zhang [26] incorporated an auxiliary camera so active SL is combined with passive stereo.…”

Section: Related Workmentioning

confidence: 99%

Absolute phase unwrapping with SVM for fringe‐projection profilometry

Xiang

et al. 2020

IET image process

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Section: Related Workmentioning

confidence: 99%

Absolute phase unwrapping with SVM for fringe‐projection profilometry

Xiang

et al. 2020

IET image process

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“…2019, 9, 1458 2 of 12 the red, green and blue channels of a one-colour image, and this allows very fast phase-shifted fringe pattern acquisition. Zhang et al [10][11][12] used different numbers of encoded 1-bit binary dithered patterns or just defocus binary fringes to realize fast 3D surface measurements and a good result was obtained under laboratory conditions. In these works, the performance of TI's digital micro-mirror device (DMD) projector with high-speed binary images projection was fully developed.…”

Section: Introductionmentioning

confidence: 99%

3D Face Profilometry Based on Galvanometer Scanner with Infrared Fringe Projection in High Speed

Xue

Zhang

et al. 2019

Applied Sciences

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Structured light 3D shape metrology has become a very important technique and one of the hot research topics in 3D face recognition. However, it is still very challenging to use the digital light projector (DLP) in a 3D scanner and achieve high-speed, low-cost, small-size, and infrared-illuminated measurements. Instead of using a DLP, this paper proposes to use a galvanometer scanner to project phase-shifted fringes with a projection speed of infrared fringes up to 500 fps. Moreover, the measurement accuracy of multi-frequency (hierarchical) and multi-wavelength (heterodyne) temporal phase unwrapping approaches implemented in this system is analyzed. The measurement accuracy of the two methods is better than 0.2 mm. Comparisons are made between this method and the classical DLP approach. This method can achieve a similar accuracy and repeatability compared to the classical DLP method when a face mask is measured. The experiments on real human face indicate that this proposed method can improve the field of 3D scanning applications at a lower cost.

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“…Three-dimensional shape measurement systems that use contactless methods are necessary in many industrial fields [1]. A grating projection method is often used as a high accuracy, high speed, and real-time 3D shape measurement method [2][3][4]. It can also be effectively applied to a wide and smooth curved surface object, such as a deformed sheet, a press formed object, and a space deployable structure.…”

Section: Introductionmentioning

confidence: 99%

Development of Quick Three-Dimensional Shape Measurement Projection Mapping System Using a Whole-Space Tabulation Method

et al. 2019

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A grating projection method is often used as a highly accurate 3D shape measurement method. A real-time 3D shape measurement system can also be applied to measure a wide and smooth curved surface, such as in sheet metal processing. In this case, operators take much effort to recognize the positions of some problem areas on an object from a measured result displayed on a monitor. This study develops a projection mapping system projecting an evaluation image, such as height, displacement, gradient, curvature factor, and area of defect, onto an object. These evaluation results are obtained from the measured 3D shape. The evaluation image should be deformed according to the 3D shape of the object because the camera and projector positions are different. Therefore, this study proposes a method to quickly produce a deformed evaluation image using a whole-space tabulation method. A coordinate transform table allowed the conversion of a camera pixel coordinate into a projector pixel coordinate by using reference planes to apply deformation to the evaluation image according to the measured 3D shape. The quick coordinate transformation from a camera pixel coordinate into a projector pixel coordinate was realized using the coordinate transform table. This is a key idea of this study. It was confirmed that the coordinate transformation from the camera pixel coordinate to the projector coordinate could be performed in 4.5 ms using the coordinate transform table. In addition, 3D shape measurement projection mapping was applied to a curved sheet metal with small deformation, and the deformation part was clearly shown by projecting the height distribution. The architecture and the experimental results are shown herein.

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Superfast 3D absolute shape measurement using five binary patterns

Cited by 64 publications

References 20 publications

Absolute phase unwrapping with SVM for fringe‐projection profilometry

Absolute phase unwrapping with SVM for fringe‐projection profilometry

3D Face Profilometry Based on Galvanometer Scanner with Infrared Fringe Projection in High Speed

Development of Quick Three-Dimensional Shape Measurement Projection Mapping System Using a Whole-Space Tabulation Method

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