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Götz, Martín; Grajcar, M.; Il'ichev, E.; Khanin, V. V.; Zorin, A. B.; Niemeyer, J.; Meyer, H.‐G.

doi:10.1103/physrevb.62.r14645

Cited by 5 publications

(1 citation statement)

References 13 publications

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“…One possible future direction is to directly measure the current-phase relation on these junctions to see if these indeed conform to the expectations seen theoretically for SNIS junctions with a nonzero concentration of pinholes. [35][36][37][38][39][40][41][42][43][44] Understanding precisely what happens to these junctions by measuring the CPR, as well as revisiting TEM images of these junctions-especially junctions which result in device failures-should go a long way in clarifying their composition, as well as providing insight into improving their synthesis for future, large-scale applications.…”

Section: Discussionmentioning

confidence: 99%

Disorder and critical current variability in Josephson junctions

Sulangi

Weingartner

Pokhrel

et al. 2020

Journal of Applied Physics

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We investigate theoretically the origins of observed variations in the critical currents of Nb/Al-AlOx/Nb Josephson junctions in terms of various types of disorder. We consider the following disorder sources: vacancies within the Al layer; thickness variations in the AlOx layer; and "pinholes" (i.e., point contacts) within the AlOx layer. The calculations are all performed by solving the microscopic Bogoliubov-de Gennes Hamiltonian self-consistently. It is found that a small concentration of vacancies within the Al layer is sufficient to suppress the critical current, while the presence of a small number of thick regions of the oxide layer induces a similar effect as well. The pinhole scenario is found to result in anomalous behavior that resembles neither that of a pure tunnel junction nor that of an SNS junction, but a regime that interpolates between these two limits. We comment on the degree to which each of the three scenarios describes the actual situation present in these junctions. arXiv:1908.08360v1 [cond-mat.supr-con]

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Section: Discussionmentioning

confidence: 99%

Disorder and critical current variability in Josephson junctions

Sulangi

Weingartner

Pokhrel

et al. 2020

Journal of Applied Physics

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Setup for Experiments on the Supercurrent-Phase Relation in Bloch Transistors — Status and Possible Applications

Götz

Khanin

Zorin

et al. 2002

International Workshop on Superconducting Nano-Electronics Devices

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The current-phase relation in Josephson junctions

Golubov

Kupriyanov

Il’ichev³

2004

Rev. Mod. Phys.

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1,296

1,362

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This review provides a theoretical basis for understanding the current-phase relation (C⌽R) for the stationary (dc) Josephson effect in various types of superconducting junctions. The authors summarize recent theoretical developments with an emphasis on the fundamental physical mechanisms of the deviations of the C⌽R from the standard sinusoidal form. A new experimental tool for measuring the C⌽R is described and its practical applications are discussed. The method allows one to measure the electrical currents in Josephson junctions with a small coupling energy as compared to the thermal energy. A number of examples illustrate the importance of the C⌽R measurements for both fundamental physics and applications.

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Supercurrent-phase relation of anNb/AlOx/A

Cited by 5 publications

References 13 publications

Disorder and critical current variability in Josephson junctions

Disorder and critical current variability in Josephson junctions

Setup for Experiments on the Supercurrent-Phase Relation in Bloch Transistors — Status and Possible Applications

The current-phase relation in Josephson junctions

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