1999
DOI: 10.1006/spmi.1999.0719
|View full text |Cite
|
Sign up to set email alerts
|

Superconductor/semiconductor nanostructures on p-type InAs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
11
0

Year Published

2001
2001
2019
2019

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 15 publications
(11 citation statements)
references
References 24 publications
(29 reference statements)
0
11
0
Order By: Relevance
“…Such structures, reviewed in Ref. [25], have been realized by contacting InAs surface inversion layers [26,27] We show how to design and control MBS in a pS system with a stripe of the superconducting layer removed to form an effective one-dimensional topological supercon- ductor. This forms a pS-N-pS junction as sketched in Fig.…”
mentioning
confidence: 99%
“…Such structures, reviewed in Ref. [25], have been realized by contacting InAs surface inversion layers [26,27] We show how to design and control MBS in a pS system with a stripe of the superconducting layer removed to form an effective one-dimensional topological supercon- ductor. This forms a pS-N-pS junction as sketched in Fig.…”
mentioning
confidence: 99%
“…In a number of experiments, the current-voltage characteristics (IVCs) were measured in superconductor-normal metal-superconductor (SNS) junctions consisting of a highmobility two-dimensional electron gas (2DEG) connected to two bulk superconducting electrodes [1][2][3][4][5][6]. In these devices, the electrodes have a large width w up to 40 μm, whereas the distance L between the electrodes varies between 0.2 and 1 μm.…”
Section: Introductionmentioning
confidence: 99%
“…This is comparable or larger than the coherence length ξ N =hv F / , where v F is the Fermi velocity in the 2DEG but much smaller than the elastic-and inelastic-scattering lengths. These junctions show well-pronounced Josephson effect and have rather small NS interface resistances which correspond to a large transmission coefficient of ∼ 0.8 [4,6].…”
Section: Introductionmentioning
confidence: 99%
“…T c values in the range of 24-39 K were usually achieved in thin films prepared by these methods. However, the rather high processing temperatures used during these methods are unsuitable for multilayer or heterostructure device fabrication in systems where interfacial chemical reactions or diffusion at the interfaces during preparation is disastrous for device function-ing, e.g., in superconductor/semiconductor hybrids [26][27][28][29][30] and superconductor/ferromagnetic metal proximity-related heterostructures [31,32]. Furthermore, the difficulty in thin film preparation at high temperatures is related to the high vapor pressure and volatility of Mg, starting even at modest temperatures.…”
Section: Introductionmentioning
confidence: 99%