1998
DOI: 10.1006/spmi.1998.0603
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Superconductivity and normal state resistivity of Ba0.6K0.4BiO3: an optical phonon approach

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Cited by 6 publications
(2 citation statements)
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“…The additional term due to the electron-electron contribution was required in understanding the resistivity behaviour, as extensive attempts to fit the data with residual resistivity and phonon resistivity were unsuccessful. The power temperature dependence of ρ diff on electron-electron scattering was also earlier noticed in hole-doped manganites [15], cuprates [17], bismuth oxides [18], doped fullerides [19], diborides [20] and intermetallic alloys [21]. The departure from electron-phonon-induced resistivity behaviour could be ascribed to either the change in dimensionality or the change in carrier density.…”
Section: Electrical Resistivitysupporting
confidence: 63%
“…The additional term due to the electron-electron contribution was required in understanding the resistivity behaviour, as extensive attempts to fit the data with residual resistivity and phonon resistivity were unsuccessful. The power temperature dependence of ρ diff on electron-electron scattering was also earlier noticed in hole-doped manganites [15], cuprates [17], bismuth oxides [18], doped fullerides [19], diborides [20] and intermetallic alloys [21]. The departure from electron-phonon-induced resistivity behaviour could be ascribed to either the change in dimensionality or the change in carrier density.…”
Section: Electrical Resistivitysupporting
confidence: 63%
“…The additional term due to the electron-electron contribution was required in understanding the resistivity behaviour, as extensive attempts to fit the data with residual resistivity and phonon resistivity were unsuccessful. The power temperature dependence of ρ dif with electron-electron scattering was also earlier noticed in copper oxides [10], bismuth oxides [11], doped fullerides [12], and sulfides like TiS 2 [13]. The departure from electron-phonon induced resistivity behaviour could be ascribed to either the change in dimensionality or the change in carrier density/mobility.…”
Section: Electrical Resistivitysupporting
confidence: 60%