2015
DOI: 10.1063/1.4931943
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Superconducting properties and chemical composition of NbTiN thin films with different thickness

Abstract: In this research, we systematically investigated the superconducting properties and chemical composition of NbTiN thin films prepared on single-crystal MgO substrates. The NbTiN thin films with different thicknesses (4–100 nm) were deposited by reactive DC magnetron sputtering at ambient temperature. We measured and analyzed the crystal structure and thickness dependence of the chemical composition using X-ray diffraction and X-ray photoelectron spectroscopy depth profiles. The films exhibited excellent superc… Show more

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Cited by 28 publications
(30 citation statements)
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“…We observed a maximum resistivity of 3.61 μΩm with 5.4-nm-thick thin film, where the T c was 5.3K. The obtained resistivity was higher compared to that reported in other researches [18], [23], [24]. Although this could be caused by influence of the grain boundary and the crystallinity, it is still under investigation.…”
Section: Characteristics Of Nbtin Thin Filmscontrasting
confidence: 54%
“…We observed a maximum resistivity of 3.61 μΩm with 5.4-nm-thick thin film, where the T c was 5.3K. The obtained resistivity was higher compared to that reported in other researches [18], [23], [24]. Although this could be caused by influence of the grain boundary and the crystallinity, it is still under investigation.…”
Section: Characteristics Of Nbtin Thin Filmscontrasting
confidence: 54%
“…2(c) selected area electron diffraction results are presented, showing a ring pattern typical for polycrystalline films. As can be seen in the inset, the [200] lattice spacing (obtained by azimuthal integration using the PASAD plug-in [22] and Digital Micrograph software) was found to scale with the Nb fraction x, which is expected for the fully miscible ternary NbTiN alloy [19]. We note that the lattice parameters were extracted from films grown on SiN TEM support films with a thickness of 10 nm, which most probably does not correspond to the lattice parameters of films deposited on SiO 2 /Si substrates due to different levels of microscopic strain [23].…”
Section: Superconducting Thin Film Deposition and Characterizationmentioning
confidence: 85%
“…In parallel, XPS measurements were performed to study the different compositions of the 50 nm films, using a PHI Quantera II Scanning ESCA microprobe with monochromatic Al Kα radiation and a spot size of 100 µm. The composition of the top surface, a native oxide layer as observed elsewhere [19], as well as the average bulk composition of the superconducting layer were determined. For the latter, 1 kV Ar + sputter etched depth profiles with an area of 1x1 mm 2 were conducted, the thickness of 50 nm allowing for the etching without removing the underlying NbTiN layer and for comparing values close to bulk conditions.…”
Section: Superconducting Thin Film Deposition and Characterizationmentioning
confidence: 99%
“…We attribute this to the highly textured growth of NbTiN induced by the removal of the native amorphous oxide layer. We note that only this NbTiN thin film exhibited diffraction peaks in x-ray scans which can be attributed to a highly textured film with the (002) plane of the cubic phase oriented parallel to the substrate surface [28,29]. A detailed analysis of the x-ray diffraction of this sample has been added to the supplemental material (SM) (https://stacks.iop.org/MQT/2/015002/mmedia) section 1 [30].…”
Section: Methodsmentioning
confidence: 99%