2014
DOI: 10.1016/j.apsusc.2014.05.200
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Superconducting MoC thin films with enhanced sheet resistance

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Cited by 10 publications
(8 citation statements)
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“…The preparation details are given in Ref. 16. The transport properties of the MoC thin films have been obtained by four-probe measurements.…”
Section: Moc Thin Film and Cpw Resonatormentioning
confidence: 99%
“…The preparation details are given in Ref. 16. The transport properties of the MoC thin films have been obtained by four-probe measurements.…”
Section: Moc Thin Film and Cpw Resonatormentioning
confidence: 99%
“…The details can be found elsewhere [17]. The preparation followed the procedure of Lee and Ketterson [18] who manufactured continuous MoC films down to 0.4 nm thickness showing…”
Section: Introductionmentioning
confidence: 99%
“…The details can be found elsewhere [17]. The preparation followed the procedure of Lee and Ketterson [18] The inset of Fig.…”
mentioning
confidence: 99%
“…MoC films of 3 nm thickness were prepared by the reactive magnetron sputtering onto a Si substrate as described in [12,13]. The Ioffe-Regel parameter kFl was determined for all our thin MoC films [6,12] from the free-electron-model. Transport and STM measurements were performed in magnetic fields up to 16 and 8 T, respectively, all at temperatures down to 0.3 K. Details are in Suppl.…”
mentioning
confidence: 99%