Dynamic interactions between two oscillating micromechanical cantilevers are studied. In the experiment, the tip of a high-frequency cantilever is positioned near the surface of a second lowfrequency cantilever. Due to the highly nonlinear interaction forces between the two surfaces, thermal oscillations of the low-frequency cantilever modulate the driven oscillations of the highfrequency cantilever. The dissipations and the frequencies of the two cantilevers are shown to be coupled, and a simple model for the interactions is presented. The interactions studied here may be useful for the design of future micro and nanoelectromechanical systems for mechanical signal processing; they may also help realize coupled mechanical modes for experiments in non-linear dynamics. [6,7].
Miniaturized mechanical devicesHere, we study dynamic interactions between two oscillating micromechanical cantilevers and harvest these interactions for mechanical signal modulation and detection. In the experiment, the carrier signal from a high-frequency microcantilever oscillator is modulated by low-frequency thermal oscillations of a second microcantilever by simply bringing the two microcantilevers close together. The approach relies upon the strong inherent nonlinearity of the interaction force between two surfaces in close proximity and offers several advantages. The modulation is purely mechanical, and mechanical signals need not be converted to electrical signals. The strength of the coupling between the two mechanical signals, and hence the modulation index, can be adjusted by changing the distance between the two microcantilevers. Conservative and dissipative components of the interaction enable tuning of the frequencies and dissipation. Conversely, monitoring the modulation on the carrier signal allows for sensitive mechanical displacement detection. Because the approach offers prospects for creating coupled mechanical modes [10] with tunable coupling, it may be useful in fundamental investigations in nonlinear dynamics.Our approach is derived from dynamic mode atomic force microscopy (AFM). Related to our work here, various AFM modalities have been used to detect the motion of micro-and nano-mechanical resonators. In these