Sulfonated Cross-Linked Poly(ether ether ketone) Films with Wrinkled Structures: Preparation and Vanadium Ions Permeability

Lafi, Abdul G. Al; Hasan, Reem; Al-Kafri, Nedal

doi:10.1007/s13233-019-7166-5

Cited by 6 publications

(2 citation statements)

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“…It has been recently reported that wrinkled structures were formed on the surface of cross‐linked SPEEK membranes, which increased the surface area of the membranes and as a result its adsorption capacity. [ 55 ] By considering the previous facts, the results obtained from 2D‐CM‐RBS analysis were consistent with the underlying physics and reported literatures. Thus, the method could be used to analyze RBS data.…”

Section: Resultssupporting

confidence: 89%

RBSandPIXEdata analysis by two dimensional correlation mapping techniques: On the effects of ion irradiation and sulfonation on poly(ether ether ketone) membranes

Lafi

Rihawy

2020

X-Ray Spectrometry

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The present work proposes the use of two‐dimensional correlation mapping (2D‐CM) methods to analyze both particle induced X‐ray emission (PIXE) and Rutherford back scattering (RBS) spectra. RBS spectra of ion irradiated (H+ and He2+) poly(ether ether ketone) (PEEK) films were analyzed by both generalized and hybrid 2D‐CM techniques to reveal the chemistry involved in different ion irradiation types. The analysis indicated different irradiation mechanisms using He2+ and H+ high energy ion beams and was assigned to X‐linking and Y‐linking, respectively. The effects of sulfonation on the structure of PEEK membranes were also analyzed from their RBS and PIXE spectra. The sequential order of elemental concentration change with increasing the degree of sulfonation (DS) was determined as: N→S→O→C, and the origin of Nitrogen was assigned to the casting solvent as revealed from nuclear magnetic resonance (NMR) spectra. In addition, Hetro‐2D‐CM‐PIXE‐RBS analysis indicated the presence of three RBS Sulfur signals, and were assigned to Sulfur at surface, in the middle and in depth. 2D‐CM techniques could be considered as a promising approach to enrich information obtained by ion beam analysis.

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Section: Resultssupporting

confidence: 89%

RBSandPIXEdata analysis by two dimensional correlation mapping techniques: On the effects of ion irradiation and sulfonation on poly(ether ether ketone) membranes

Lafi

Rihawy

2020

X-Ray Spectrometry

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“…Poly (ether ether ketone) (PEEK) is a specialty rather than commodity plastics, having an excellent combination of mechanical strength and material stabilities in severe conditions. These characteristics have motivated the utilization of PEEK in aerospace and nuclear industries [ 1 , 2 ], besides its application as structural materials for fuel cells, redox flow batteries and high effective adsorbents [ 3 , 4 , 5 ]. The later applications require PEEK to be in the form of highly sulphonated polymer, which elevated the per-cluster volume of SO 3 H groups in the membranes, and controls the water uptake, ion exchange capacity (IEC) and consequently proton conductivity of the membranes.…”

Section: Introductionmentioning

confidence: 99%

Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Lafi

AL-Zier

Allaf

2021

Heliyon

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Proton irradiated poly (ether ether ketone) (PEEK) films were crystallized to different extents, and subsequently characterized by wide angle X-ray diffraction technique. The data were analyzed by two-dimensional correlation mapping (2D-CM), in particular: Generalized, hybrid and multiple perturbations correlation approaches. Two asynchronous correlation peaks at (19.1, 18.7) o and at (22.5, 19.1) o were utilized as a measure the crystal perfection and the preferred process; orientation/crystal growth respectively. Proton irradiation not only favored the formation of crystal form II, but also changed the type of orientation within the irradiated films. Differential scanning calorimetry and Raman spectroscopic analysis confirmed the contribution of the previous two factors. Raman spectra indicated that the intensity of both bands at 1595 and 1608 cm −1 decreased on samples crystallized from the melt, but increased on cold crystallized samples. 2D-CM combined with other suitable techniques is a promising in evaluating the structure of polymers and revealing the effect of proton irradiation.

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Cross-linking of poly (ether ether ketone) and its sulfonated form: A spectroscopic study

et al. 2022

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Sulfonated Cross-Linked Poly(ether ether ketone) Films with Wrinkled Structures: Preparation and Vanadium Ions Permeability

Cited by 6 publications

References 50 publications

RBSandPIXEdata analysis by two dimensional correlation mapping techniques: On the effects of ion irradiation and sulfonation on poly(ether ether ketone) membranes

RBSandPIXEdata analysis by two dimensional correlation mapping techniques: On the effects of ion irradiation and sulfonation on poly(ether ether ketone) membranes

Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Cross-linking of poly (ether ether ketone) and its sulfonated form: A spectroscopic study

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