2006
DOI: 10.1016/j.ultramic.2006.04.019
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Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3

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Cited by 73 publications
(62 citation statements)
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“…The shape of the L 2;3 edge [10], the chemical shift [11,12] and the L 3 =L 2 ratio [13] have all been used as a fingerprint for the transition metal valence. In fact, the correlation between the energy-loss near-edge structure (ELNES) and valence in different transition metal oxides was confirmed by several experiments in literature [10,[14][15][16][17][18][19][20][21]. The higher the energy resolution, the more convincing this link between valence and ELNES features becomes.…”
mentioning
confidence: 62%
“…The shape of the L 2;3 edge [10], the chemical shift [11,12] and the L 3 =L 2 ratio [13] have all been used as a fingerprint for the transition metal valence. In fact, the correlation between the energy-loss near-edge structure (ELNES) and valence in different transition metal oxides was confirmed by several experiments in literature [10,[14][15][16][17][18][19][20][21]. The higher the energy resolution, the more convincing this link between valence and ELNES features becomes.…”
mentioning
confidence: 62%
“…1b; see the guiding A and B circles, Fig. 1b-f) demonstrates that atomic resolution was systematically obtained in each map, unprecedented for the spatially resolved investigations of dislocations [17][18][19][20][21][22][23][24] . Intriguingly, the Mn-Ti interdiffusion shows a radial pattern centred at the dislocation (see the dashed arcs, Fig.…”
Section: Resultsmentioning
confidence: 89%
“…In Fig. 1a (inset), the low-angle ADF (LAADF) imaging, a classical approach for revealing dislocation-strain contrasts 5,19 , resolves the characteristic strain field of the dislocations (arrows). The close HAADF inspection of an individual dislocation ( Fig.…”
Section: Resultsmentioning
confidence: 99%
“…While the first operation would leave the length of the c-axis unaltered, the latter would even shrink it resulting in a strong contraction of the unit cell volume. Figure 1D shows the strain pattern associated with the misfit dislocation structure of a 7.1 nm thick film projected on the interface plane, using annular dark field scanning transmission electron microscopy at low beam convergence angles (Fitting et al, 2006). The density of the pattern can be manipulated through the thickness of the film.…”
Section: Misfit Strainmentioning
confidence: 99%