Abstract:The unbiased Langmuir probe (LP) method was used to perform measurements on HfO2 and ZrO2 samples around the laser ablation threshold on a wide range of irradiation conditions. Important changes in the lifetime (from ms to μs) and the shape of the charge particle current were seen with the increase of the laser fluence. The ablation threshold was estimated by evaluating the overall average ablated charge as a function of the laser fluence. Above the ablation threshold, the generation of high kinetic species is… Show more
“…In our previous work [ 20 ] , we have shown that LP signal can be used to quantify the ablation threshold value by using the average current representation as a function of the laser fluence. Here we expand the procedure by analyzing the variation of the ejected charge (Figure 4(a)) and the sample compensation charge (Figure 4(b)) as a function of laser fluence.…”
Section: Resultsmentioning
confidence: 99%
“…The scenarios for material removal from the target follow a complex interconnectivity of electrostatic and thermal mechanisms, which are temporally and spatially separated: the first stages of laser ablation are of an electrostatic nature, while the second stages are of a thermal nature. In our previous work [ 20 ] , we have shown that the Langmuir probe (LP) is a suitable technique for estimating the nanosecond ablation threshold limit as it detects contributions from each stage [ 21 ] . Other reports focus on LP measurements of ablation threshold in the ns regime [ 22 ] , while reports on the detection of the fs-incubation stage emphasize the necessity of having a minimum of 10,000 pulses to estimate the threshold [ 23 ] .…”
With ultrafast laser systems reaching presently 10 PW peak power or operating at high repetition rates, research towards ensuring the long-term, trouble-free performance of all laser-exposed optical components is critical. Our work is focused on providing insight into the optical material behavior at fluences below the standardized laser-induced damage threshold (LIDT) value by implementing a simultaneous dual analysis of surface emitted particles using a Langmuir probe (LP) and the target current (TC). HfO 2 and ZrO 2 thin films deposited on fused silica substrates by pulsed laser deposition at various O 2 pressures for defect and stoichiometry control were irradiated by Gaussian, ultrashort laser pulses (800 nm, 10 Hz, 70 fs) in a wide range of fluences. Both TC and LP collected signals were in good agreement with the existing theoretical description of laser-matter interaction at an ultrashort time scale. Our approach for an in situ LIDT monitoring system provides measurable signals for below-threshold irradiation conditions that indicate the endurance limit of the optical surfaces in the single-shot energy scanning mode. The LIDT value extracted from the LP-TC system is in line with the multipulse statistical analysis done with ISO 21254-2:2011(E). The implementation of the LP and TC as on-shot diagnostic tools for optical components will have a significant impact on the reliability of next-generation ultrafast and high-power laser systems.
“…In our previous work [ 20 ] , we have shown that LP signal can be used to quantify the ablation threshold value by using the average current representation as a function of the laser fluence. Here we expand the procedure by analyzing the variation of the ejected charge (Figure 4(a)) and the sample compensation charge (Figure 4(b)) as a function of laser fluence.…”
Section: Resultsmentioning
confidence: 99%
“…The scenarios for material removal from the target follow a complex interconnectivity of electrostatic and thermal mechanisms, which are temporally and spatially separated: the first stages of laser ablation are of an electrostatic nature, while the second stages are of a thermal nature. In our previous work [ 20 ] , we have shown that the Langmuir probe (LP) is a suitable technique for estimating the nanosecond ablation threshold limit as it detects contributions from each stage [ 21 ] . Other reports focus on LP measurements of ablation threshold in the ns regime [ 22 ] , while reports on the detection of the fs-incubation stage emphasize the necessity of having a minimum of 10,000 pulses to estimate the threshold [ 23 ] .…”
With ultrafast laser systems reaching presently 10 PW peak power or operating at high repetition rates, research towards ensuring the long-term, trouble-free performance of all laser-exposed optical components is critical. Our work is focused on providing insight into the optical material behavior at fluences below the standardized laser-induced damage threshold (LIDT) value by implementing a simultaneous dual analysis of surface emitted particles using a Langmuir probe (LP) and the target current (TC). HfO 2 and ZrO 2 thin films deposited on fused silica substrates by pulsed laser deposition at various O 2 pressures for defect and stoichiometry control were irradiated by Gaussian, ultrashort laser pulses (800 nm, 10 Hz, 70 fs) in a wide range of fluences. Both TC and LP collected signals were in good agreement with the existing theoretical description of laser-matter interaction at an ultrashort time scale. Our approach for an in situ LIDT monitoring system provides measurable signals for below-threshold irradiation conditions that indicate the endurance limit of the optical surfaces in the single-shot energy scanning mode. The LIDT value extracted from the LP-TC system is in line with the multipulse statistical analysis done with ISO 21254-2:2011(E). The implementation of the LP and TC as on-shot diagnostic tools for optical components will have a significant impact on the reliability of next-generation ultrafast and high-power laser systems.
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