Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials

Top loaded TM01δ Mode Cylindrical Dielectric Resonator for Complex Permittivity Characterization of Liquids

“…It is also concluded that for liquids with dielectric constant above 30 the CDR is less sensitive for smaller LUT quantities. This behavior of the resonator is expected as the sensitivity is differential of fractional change with respect to dielectric constant (3) therefore for high dielectric constant materials it becomes less sensitive [4].…”

“…Among various material categories, characterization of liquids is very important due to their vast applications in pharmaceutical and chemical industry [3]. For characterization of liquids, Substrate Integrated Waveguide (SIW) sensor based on the cavity perturbation theory has been proposed earlier [4], [5]. SIWs are planar and highly sensitive to a small change in cavity but their realization is complex.…”

Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications

“…Cassivi and colleagues (Cassivi, 2002) report on the dispersion characteristics of a substrate integrated rectangular waveguide for the first time and provide approximate equations to estimate the cut-off frequency of the first and second propagating modes. In this section we report on how the substrate integrated waveguide cavity resonator could be used to characterize solvents in small volumes (Saeed, 2008). The sensor is compact and highly sensitive which makes it an ideal candidate to be used for dielectric measurements in the pharmaceutical industry.…”

Characterization of substrate anisotropy using substrate integrated waveguide technology

“…Recently, the substrate integrated waveguide (SIW) technology has been used in the complex permittivity measurement. The low cost, relatively high Q factor, compact size and ease of manufacture make the SIW technology attractive for the characterization of dielectric materials [2]. Broadband dielectric permittivity of substrate material has been acquired using the transmission/reflection method based on SIW transmission lines [3].…”