Abstract:In this contribution, the extent to which the Nyquist criterion can be violated in optical imaging systems with a digital sensor, e.g., a digital microscope, is investigated. In detail, we analyze the subpixel uncertainty of the detected position of a step edge, the edge of a stripe with a varying width, and that of a periodic rectangular pattern for varying pixel pitches of the sensor, thus also in aliased conditions. The analysis includes the investigation of different algorithms of edge localization based o… Show more
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