2016
DOI: 10.1103/physrevlett.116.096102
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Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force

Abstract: The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understand the contrast in atomically resolved AFM images of polar molecules. Specifically, we image strongly polarized molecules with negatively and positively charged tips. A contrast inversion is observed above the polar groups. By taking into account the electrostatic forces between tip… Show more

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Cited by 56 publications
(63 citation statements)
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References 43 publications
(55 reference statements)
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“…In systems where this is a problem, considering several experimental configurations of the same molecule, as done here, makes identification significantly easier. More generally, we are looking at including multiple channels of information for a single configuration by using an image descriptor incorporating tip-dependent electrostatic information available via other tip terminations 51,24,45 . This could be also be extended to incorporate simultaneous fitting to Kelvin Probe Force Microscopy data 52,53,54,55 , further improving the uniqueness of predictions.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…In systems where this is a problem, considering several experimental configurations of the same molecule, as done here, makes identification significantly easier. More generally, we are looking at including multiple channels of information for a single configuration by using an image descriptor incorporating tip-dependent electrostatic information available via other tip terminations 51,24,45 . This could be also be extended to incorporate simultaneous fitting to Kelvin Probe Force Microscopy data 52,53,54,55 , further improving the uniqueness of predictions.…”
Section: Discussionmentioning
confidence: 99%
“…Instead, the characteristic topology of interatomic potentials (saddle ridges between nearby atoms, vertexes between those ridges, contrast inversion) can be clearly determined from AFM data as a fingerprint of typical chemical groups or bonding configurations. The electrostatic force has a rather small contribution to vertical force in contact, but often considerably distorts the image laterally 24,45 .…”
Section: Introductionmentioning
confidence: 99%
“…Lennard-Jones parameters are the same that were used in recent literature 59 . The atomic positions were taken from the DFT-calculated geometries.…”
Section: Supplementary Note 2: Comparison Of Afm Data To Simulated Afmentioning
confidence: 99%
“…From DFT calculations the lateral stretching in the graphene network induced by the substitutional dopant is only about 1% in compression to the nearest-neighbor distance. Thus these distortions are imaging artifacts and are most likely due to the electrostatic interaction between the dopant atom, which has a partial positive charge, and the dipole moment of the tip [42,43,47,48]. A Bader charge analysis shows that the N atom has a charge of 1.27e, where 73% of that charge is extracted from the 3 neighboring C atoms donating 0.3e each to the N atom.…”
Section: Referencementioning
confidence: 99%