Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

Siketić, Zdravko; Radović, Ivančica Bogdanović; Jakšić, Milko; Hadžija, Mirko

doi:10.1063/1.4930062

Cited by 15 publications

(15 citation statements)

References 30 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The highest values were obtained with Leucine which is in good agreement with other reported data [9]. The observed secondary ion rates per incident primary beam particle and time resolution are currently not far from those of similar systems [10,13]. However, as mentioned above, absolute numbers for the detection efficiency of the ToF spectrometer cannot be deduced [21].…”

Section: Fig 2: Positive Secondary Ion Mass Spectrum Of a Solid Goldsupporting

confidence: 88%

See 1 more Smart Citation

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Schulte-Borchers

Döbeli

Müller

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

A new Time-of-flight MeV Secondary Ion Mass Spectrometry (MeV-SIMS) setup was developed to be used with a capillary microprobe for molecular imaging with heavy primary ions at MeV energies. Due to the low output current of the ion collimating capillary a time-of-flight (ToF) measurement method with high duty cycle is necessary. Secondary electrons from the sample surface and transmitted ions were studied as start signals. They enable measurements with a continuous primary beam and unpulsed ToF spectrometer. Tests with various primary ion beams and sample types have shown that a secondary electron signal is obtained from 30 to 40 % of incident MeV particles. This provides a ToF start signal with considerably better time resolution than the one obtained from transmitted primary ions detected in a radiation hard gas ionization detector. Beam induced secondary electrons therefore allow for MeV-SIMS measurements with reasonable mass resolution at primary ion beam currents in the low fA range.

show abstract

Section: Fig 2: Positive Secondary Ion Mass Spectrum Of a Solid Goldsupporting

confidence: 88%

“…In early systems working with fission sources the recoil nucleus was used to produce the ToF start signal [3] which is no option in accelerator based setups. For thin samples the transmitted primary ion can be detected [13]. However, this approach complicates sample preparation and limits the applicability of the technique.…”

Section: Introductionmentioning

confidence: 99%

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Schulte-Borchers

Döbeli

Müller

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

show abstract

“…OCT-embedded blocks of frozen liver tissue were removed from the freezer and sectioned inside a cryostat-microtome held at À25°C. The liver tissue sections were selected to be 5 lm thick to allow transmission of 9 MeV O 4+ ions through the sample to use high lateral resolution mode for MeV TOF-SIMS measurements [18]. One of the sections was immediately placed onto a 100-nm-thick Si 3 N 4 window and freezedried overnight.…”

Section: Treatment Of Mice and Preparation Of Mouse Liver Tissue And mentioning

confidence: 99%

“…We have already successfully applied MeV TOF-SIMS for imaging human adenocarcinoma cells at the subcellular level [18]. The goal of the present study was to determine early events in the development of glucoregulatory impairment in the prediabetic (spontaneously developed) and HFD-induced diabetic mouse model, with a focus on lipids in the liver tissue and also in the serum.…”

Section: Introductionmentioning

confidence: 99%

Study of the diacylglycerol composition in the liver and serum of mice with prediabetes and diabetes using MeV TOF-SIMS

Siketić

Hadžija

Barac

et al. 2020

Diabetes Research and Clinical Practice

Self Cite

View full text Add to dashboard Cite

Hepatic insulin resistance, induced by fat, occurs before peripheral resistance and leads to prediabetes and diabetes. If insulin resistance is detected earlier, lifestyle changes could prevent or delay disease development. Therefore, we analysed lipids in the liver and serum of prediabetic and diabetic mice by MeV TOF-SIMS with a focus on diacylglycerols (DAGs) as the best predictor of (liver) resistance. Methods: Glucose impairment was spontaneously developed or induced by HFD in NOD/LtJ mice, and prediabetic and diabetic mice were selected according to their glucose levels. MeV TOF-SIMS was applied to image the lipid distribution in the liver and to relatively quantify lipids related to insulin resistance in both the liver and serum. Results: The same lipids were detected in the liver and serum but with different intensities between mice. The intensity of DAGs and fatty acids was higher in the diabetic than that in the prediabetic liver. Imaging of liver tissue showed a more compact density of prediabetic (non-fatty) than diabetic liver with DAG remodelling in diabetes. DAGs, which are greatly increased in diabetic serum, were successfully detected and quantified already in prediabetes. Conclusion: MeV TOF-SIMS applied to the serum presents an excellent tool for in vivo monitoring of disease development over time.

show abstract

“…Since TOF-ERDA is routinely carried out using broad ion beams with a diameter of a few mm, the present setup is not used for imaging. However, because there exist heavy-ion high-energy microprobes with lateral resolutions of 5 µm and below, there is a possibility of developing a system based on an ion microprobe in the future 24 – 26 .…”

Section: Introductionmentioning

confidence: 99%

Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering

Siketić

Radović

Sudić

et al. 2018

Sci Rep

Self Cite

View full text Add to dashboard Cite

The recent development of new advanced materials demands extensive effort in developing new analytical techniques that can provide insight into material composition at the nanoscale, particularly at surfaces and interfaces, which is important for both fabrication and material performance. Here, we present a proof of principle for a new setup used for thin-film characterisation and depth profiling based on a combination of time-of-flight elastic recoil detection analysis (TOF-ERDA) and Ar sputtering. A quantitative depth profiling with a best achievable surface depth resolution of ~2 nm can be realised for the entire layer, which is important for the precise determination of thickness and composition of samples that are several tenths of a nanometre thick. The performance of TOF-ERDA with Ar sputtering was demonstrated using 15 nm Cu evaporated onto a Si substrate. The advantages and limits of the method are discussed in detail.

show abstract

Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

Cited by 15 publications

References 30 publications

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Study of the diacylglycerol composition in the liver and serum of mice with prediabetes and diabetes using MeV TOF-SIMS

Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering

Contact Info

Product

Resources

About