2015
DOI: 10.1364/ao.54.010022
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Subaperture stitching for measurement of freeform wavefront

Abstract: A method based on subaperture stitching for measurement of a freeform wavefront is proposed and applied to wavefronts calculated from the slope data acquired using a scanning Shack Hartmann sensor (SHS). The entire wavefront is divided into a number of subapertures with overlapping zones. Each subaperture is measured using the SHS, which is scanned over the entire wavefront. The slope values and thus the phase values of separately measured subapertures cannot be connected directly due to various misalignment e… Show more

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Cited by 48 publications
(5 citation statements)
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“…Its designed profile is described by a seventh-order polynomial having a maximum sag of 1.119 mm. It has been fabricated on PMMA by ultraprecision machining at the Institute for Micro and Nanotechnologies (IMN) at the Technische Universität Ilmenau in Germany [3]. The used amplitude grating with a grating period of 50µm for this experiment was fabricated by means of lithography.…”
Section: Experimental Validationmentioning
confidence: 99%
See 1 more Smart Citation
“…Its designed profile is described by a seventh-order polynomial having a maximum sag of 1.119 mm. It has been fabricated on PMMA by ultraprecision machining at the Institute for Micro and Nanotechnologies (IMN) at the Technische Universität Ilmenau in Germany [3]. The used amplitude grating with a grating period of 50µm for this experiment was fabricated by means of lithography.…”
Section: Experimental Validationmentioning
confidence: 99%
“…At the same time, free-form elements open a wide field of additional functionalities allowing the minimization of the number of required components, size and weight of the system. The fabrication of highprecision free-form surfaces requires new production techniques as well as new appropriate metrology procedures and systems [2] [3].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, in recent years, many scholars have studied the optical testing methods of free-form surfaces. Thus, a number of metrology methods have been developed [7][8][9], and these methods are roughly divided into contact metrology and non-contact metrology. Because it is easy to scratch the surfaces with contact metrology, non-contact metrology is preferred for high-precision optical surfaces.…”
Section: Introductionmentioning
confidence: 99%
“…is has changed however in recent years, which can be easily noticed through the common availability of progressive lenses [9,10]. Capabilities of precise multiaxis machine tools increased to the level where completely asymmetrical optics can be manufactured [11,12]. It created new prospects for light shaping possibilities.…”
Section: Introductionmentioning
confidence: 99%
“…Considering (11) in (10), one obtains the fully nonlinear elliptic partial differential equation of Monge-Ampere type (MA PDE):…”
mentioning
confidence: 99%