The development of environmentally
friendly materials and processes is a major issue that concerns all
industrial sectors, including microelectronics. The aim of this study
is to demonstrate the possibility of using chitosan-based photoresists
for microelectronic applications on silicon by 193 nm photolithography.
The photopatterning of chitosan films is demonstrated and analyzed
by different spectroscopy and microscopy techniques. In particular,
it is shown that 193 nm irradiation allows one to induce chain breaks
that modify the solubility of chitosan in an aqueous developing solution,
without denaturing the chitosan macromolecule chains. This mechanism
allows one to obtain patterns, and it is shown that these patterns
can be transferred by physical etching into silica. It is also demonstrated
that the formulated resins are compatible with industrial spin-coating
and exposure tools, which opens very interesting perspectives for
these chitosan-based positive resins in a microelectronic context.