Synchrotron Light Sources and Free-Electron Lasers 2019
DOI: 10.1007/978-3-319-04507-8_62-1
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Sub-micrometer Focusing and High-Resolution Imaging with Refractive Lenses and Multilayer Laue Optics

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Cited by 5 publications
(6 citation statements)
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“…(b) Normalized, azimuthally averaged intensity I(q) of the signal for both detectors as shown in (a). 25,27 A stack of aberration-corrected, nano-focus compound refractive lenses (CRLs) [28][29][30] was used to focus the XFEL beam to a diffraction-limited focal spot 31,32 of 94 nm (FWHM). In the NFH configuration (Fig.…”
Section: Experiments a Experimental Approach And Schemesmentioning
confidence: 99%
“…(b) Normalized, azimuthally averaged intensity I(q) of the signal for both detectors as shown in (a). 25,27 A stack of aberration-corrected, nano-focus compound refractive lenses (CRLs) [28][29][30] was used to focus the XFEL beam to a diffraction-limited focal spot 31,32 of 94 nm (FWHM). In the NFH configuration (Fig.…”
Section: Experiments a Experimental Approach And Schemesmentioning
confidence: 99%
“…In the field of X-ray optics, refractive lenses (CRLs) and multilayer Laue lenses (MLLs) [49] are intensively developed at DESY. MMLs in particular can generate single-digit nanometre foci [50] and reach, at least in principle, a focal spot size of one nanometre [51,52].…”
Section: Beamline Technologiesmentioning
confidence: 99%
“…This however, also reduces their efficiency. Furthermore, CRLs have strong chromatic aberrations so their ability to focus to extremely small spot sizes is limited [13]. Reflective mirrors, such as Kirkpatrick-Baez (KB) mirrors, which operate at grazing incidence, can accept the full beam.…”
Section: Introductionmentioning
confidence: 99%