2021
DOI: 10.3390/ma15010272
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Study the Electrical Properties of Surface Mount Device Integrated Silver Coated Vectran Yarn

Abstract: Smart textiles have attracted huge attention due to their potential applications for ease of life. Recently, smart textiles have been produced by means of incorporation of electronic components onto/into conductive metallic yarns. The development, characterizations, and electro-mechanical testing of surface mounted electronic device (SMD) integrated E-yarns is still limited. There is a vulnerability to short circuits as non-filament conductive yarns have protruding fibers. It is important to determine the best… Show more

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Cited by 11 publications
(12 citation statements)
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“…A digital multimeter was used to measure the electrical resistance variations corresponding to varying temperatures. The relationship between the temperature and the electrical resistance of the yarn is expressed using eq .25ex2ex normale normals normalt normali normalm normala normalt normale normald 0.25em normalr normale normals normali normals normalt normala normaln normalc normale 0.25em false( R t false) = R 0 false( 1 + α normalΔ T false) where R 0 , α, and Δ T are the initial resistance at 20 °C, temperature coefficient, and temperature difference between the final and initial temperature, respectively. An initial temperature of 20 °C was selected for this experiment.…”
Section: Methodsmentioning
confidence: 99%
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“…A digital multimeter was used to measure the electrical resistance variations corresponding to varying temperatures. The relationship between the temperature and the electrical resistance of the yarn is expressed using eq .25ex2ex normale normals normalt normali normalm normala normalt normale normald 0.25em normalr normale normals normali normals normalt normala normaln normalc normale 0.25em false( R t false) = R 0 false( 1 + α normalΔ T false) where R 0 , α, and Δ T are the initial resistance at 20 °C, temperature coefficient, and temperature difference between the final and initial temperature, respectively. An initial temperature of 20 °C was selected for this experiment.…”
Section: Methodsmentioning
confidence: 99%
“…The primary reason for the resistance change is the energy the free electron loses in each interaction. 35,41 At 40− 70 °C, the change in resistance measured for the SS yarn was stable and did not exhibit a considerable amount of variation; however, the SC yarn exhibited a substantial amount of resistance variation. The material-dependent temperature coefficient (α) is the term that is used to explain the resistance−temperature relationship (eq 2).…”
Section: Effect Of Temperature On Resistance Of the Yarnmentioning
confidence: 99%
“…The electrical properties of yarns have been studied extensively. [20][21][22][23] For example, the authors of 24 studied antistatic yarns (containing bicomponent fibers with a carbon component) and confirmed the linear relationship between ER and clamping length. Moreover, the nonlinear behavior of ER on clamping length was observed for yarns containing 20% stainless steel fibers of staple length.…”
Section: Introductionmentioning
confidence: 92%
“…In addition, the total electrical resistance of the SMD embedded e-yarn was dependent on the resistance of the conductive yarn, the resistance of the solder connector, and the resistance of the SMD resistor. Therefore, the total electrical resistance of the SMD resistor integrated e-yarn can be calculated by equation (3): 34 or where U denotes the voltage source, V is the voltage drop at each node, I is the current flow in the circuit, normal normalRnormalT is the total resistance of the e-yarn, normalRnormally denotes the resistance of the left amber strand metal-clad conductive yarn. normalRnormalC represents the resistance of the yarn to the solder pad connection, normalRnormalR represents the resistance of the SMD resistor, and normalRnormalry is the electrical resistance of the right amber strand metal-clad conductive yarn.…”
Section: Encapsulation Of the E-yarnmentioning
confidence: 99%