Study on the Voltage Reference Noise at Sub-Millihertz Frequencies for Developing an Ultra-Stable Temperature Measurement Subsystem

Abstract

A temperature measurement subsystem (TMS) is a critical piece of infrastructure of the space gravitational wave detection platform, necessary for monitoring minuscule temperature changes at the level of 1μK/Hz1/2 within the electrode house, in the frequency range of 0.1mHz to 1Hz. The voltage reference (VR), a key component of the TMS, must possess low noise characteristics in the detection band to minimize the impact on temperature measurements. However, the noise characteristics of the voltage reference in the sub-millihertz range have not been documented yet and require further study. This paper reports a dual-channel measurement method for measuring the low-frequency noise of VR chips down to 0.1mHz. The measurement method makes use of a dual-channel chopper amplifier and an assembly thermal insulation box to achieve a normalized resolution of 3×10−7/Hz1/2@0.1mHz in the VR noise measurement. The seven best-performance VR chips documented at a common frequency range are tested. The results show that their noise at sub-millihertz frequencies can significantly differ from that around 1Hz.