2020
DOI: 10.1016/j.physleta.2019.126232
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Study on the properties of Pb(Zr,Ti)O3 thin films grown alternately by pulsed laser deposition and sol-gel method

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Cited by 8 publications
(4 citation statements)
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“…; research has been done to reduce size and weight of such devices, and to improve performance. [1][2][3][4] Most of these studies dealt with rigid crystalline substrates suitable for epitaxial growth of perovskite-type oxides. However, recently researchers explore formation of such thin films on flexible polymer sheet, thus assuming application to flexible wearable devices and sensors.…”
Section: Introductionmentioning
confidence: 99%
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“…; research has been done to reduce size and weight of such devices, and to improve performance. [1][2][3][4] Most of these studies dealt with rigid crystalline substrates suitable for epitaxial growth of perovskite-type oxides. However, recently researchers explore formation of such thin films on flexible polymer sheet, thus assuming application to flexible wearable devices and sensors.…”
Section: Introductionmentioning
confidence: 99%
“…Perovskite‐type oxide thin films featuring ferroelectric properties are used in non‐volatile memory, ultrasonic transducers, piezoelectric devices, etc. ; research has been done to reduce size and weight of such devices, and to improve performance 1‐4 . Most of these studies dealt with rigid crystalline substrates suitable for epitaxial growth of perovskite‐type oxides.…”
Section: Introductionmentioning
confidence: 99%
“…The reported ferroelectric-gated photodetectors with 2D channel materials, such as MoS 2 [28] and In 2 Se 3 , [29] engage ferroelectric polymer top gate, which adds complexity in device fabrication. These pioneering endeavors have inspired us to introduce the ferroelectric PbZr x Ti (1Àx) O 3 (PZT) [30][31][32] substrate as the bottom gate dielectric to tune the photoresponsivity of the GeSe-based photodetectors.…”
Section: Introductionmentioning
confidence: 99%
“…It is found that the W rec and η obtained in BF-ST/BST N =10 film are comparable to most of the BF-based films deposited via PLD, chemical solution deposition, and radio frequency magnetron sputtering methods, except for the epitaxial 0.25BiFeO 3 -0.3BaTiO 3 -0.45SrTiO 3 film. ,, Generally, ferroelectric film prepared by a PLD method is grown along the column, and thus, its structure is compact, resulting in a high E b . However, the compactness for the film prepared via a chemical solution method is decreased to some extent due to the presence of voids in microstructure caused by the volatilization of organic substance, which inevitably leads to relatively high leakage current density and reduced insulation in contrast to the PLD technique. Thus, slightly lower values of W rec and η are observed in our designed ternary film compared with the epitaxial 0.25BiFeO 3 -0.3BaTiO 3 -0.45SrTiO 3 film .…”
mentioning
confidence: 99%