“…It is found that the W rec and η obtained in BF-ST/BST N =10 film are comparable to most of the BF-based films deposited via PLD, chemical solution deposition, and radio frequency magnetron sputtering methods, except for the epitaxial 0.25BiFeO 3 -0.3BaTiO 3 -0.45SrTiO 3 film. ,,− Generally, ferroelectric film prepared by a PLD method is grown along the column, and thus, its structure is compact, resulting in a high E b . However, the compactness for the film prepared via a chemical solution method is decreased to some extent due to the presence of voids in microstructure caused by the volatilization of organic substance, which inevitably leads to relatively high leakage current density and reduced insulation in contrast to the PLD technique. Thus, slightly lower values of W rec and η are observed in our designed ternary film compared with the epitaxial 0.25BiFeO 3 -0.3BaTiO 3 -0.45SrTiO 3 film .…”