Study on the Prior Information Credibility Test in Low-Voltage Switchgear Reliability Assessment

Abstract

Reliability Assessment of low-voltage switchgear is of great significance to the safety of power system and its equipment. In this thesis, Bayes theory is introduced into the reliability Assessment of low-voltage switchgear. The main failure modes and failure rate of low-voltage switchgear has been summarized, and the fault arrangement diagram of low voltage switchgear is given in this paper. In view of the low-voltage switchgear with high reliability and relatively large number of samples, a feasible compatibility test method is proposed. Firstly, the distribution type can be tested through engineering experience and Goodness of fit test for weibull distribution. Then a prior information compatibility test is carried out by Wilcoxon rank sum test and Kolmogorov-Smirnov nonparametric test method. Finally, the prior information which is incompatible with credible site information is removed and reliable prior information is obtained. This paper lays a solid foundation for the Low-voltage switchgear reliability assessment based on Bayes theory.