2016
DOI: 10.1155/2016/2456378
|View full text |Cite
|
Sign up to set email alerts
|

Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials

Abstract: The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from AFM is slightly different from those obtained from a more typical nanoindentation force curve due to the AFM piezo’s hysteresis. In this study the nanomechanical properties of either a sulfonated polyether ether ket… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(4 citation statements)
references
References 36 publications
(53 reference statements)
0
4
0
Order By: Relevance
“…(4). This is normally translated to an empirical law that suggests to limit the indentation to about 10% of the smallest between the radius of the indenter and the thickness of the material [72,73]. Using ES, this limit can be experimentally identified, looking at the behavior, and avoiding large indentations for which the curve starts rising (see Additional file 1: Fig.…”
Section: Discussionmentioning
confidence: 99%
“…(4). This is normally translated to an empirical law that suggests to limit the indentation to about 10% of the smallest between the radius of the indenter and the thickness of the material [72,73]. Using ES, this limit can be experimentally identified, looking at the behavior, and avoiding large indentations for which the curve starts rising (see Additional file 1: Fig.…”
Section: Discussionmentioning
confidence: 99%
“…Indentations falling out of the interval 2 nm < h max < 40 nm were also rejected, as they are considered out of the range of validity of the models used. Indentations with h max ~ 3 nm are often associated to reverse position of the approach-retract parts of the F-d curve [ 35 ], causing typically large errors in the calculated moduli and frequent rejection. All the invalid data were marked as “nan” (not a number) and left blank in the corresponding map.…”
Section: Methodsmentioning
confidence: 99%
“…4. This is normally translated to an empirical law that suggests to limit the indentation to about 10% of the smallest between the radius of the indenter and the thickness of the material [69,70]. Using ES, this limit can be experimentally identified, looking at the behavior, and avoiding large indentations for which the curve starts rising (see Additional file 1 Fig.…”
Section: Discussionmentioning
confidence: 99%