Europium
sulfide (EuS) thin films are appealing as ferromagnetic
semiconductors and luminescent and optomagnetic materials owing to
their unique functional properties. With the emerging field of spintronics
and magneto-optical devices, chemical vapor deposition (CVD) offers
a versatile platform to tune the material properties and the method
to fabricate device structures needed for such applications. Herein,
we report the growth of high-quality cubic EuS via a versatile CVD process where the new Eu(III) precursors employed
facilitate the formation of the target EuS layers under moderated
process conditions. Based on the prior evaluation of the physicochemical
properties of these precursors using thermal analysis and density
functional theory studies, adequate volatility, thermal stability,
and sufficient reactivity toward potential co-reactants, namely, elemental
sulfur, could be inferred. Thus, the use of toxic hydrogen sulfide
generally needed for sulfide film depositions could be avoided, which
is a significant advantage in terms of simplifying the deposition
process. The as-deposited thin films were analyzed in terms of the
structure, composition, and morphology, revealing highly oriented
polycrystalline and stoichiometric EuS films. UV/vis measurements
yielded a band gap of around 1.6 eV, and Raman spectroscopy exhibited
a coupling between the phonons and electron spin systems of EuS. These
findings, together with the soft ferromagnetic character of the films
derived from semiconducting quantum interference device measurements,
signify the potential of CVD-grown EuS for future technological applications.