Study on electron beam emission from a low energy plasma focus device

Neog, N. K.; Mohanty, S. R.

doi:10.1016/j.physleta.2006.10.082

Cited by 33 publications

(14 citation statements)

References 25 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The maximum x-rays yield of about 4.7 J is estimated in 4-geometry at 1.5 mbar argon with 0.09% efficiency. The pressure dependence of hard x-rays emission points to the existence of e-beam, which decreases with pressure as observed by the Neog et al 18 who made direct measurements of the electron beam current and have found this behavior with pressure. Figure 4 exhibits the pinhole images of x-ray emission zones recorded on Fuji medical x-ray film by masking pinholes separately with Ag ͑50 m͒ and Ta ͑53 m͒ filters at optimum pressure.…”

supporting

confidence: 61%

Tailoring a plasma focus as hard x-ray source for imaging

Hussain

Shafiq

Zakaullah

2010

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

supporting

confidence: 61%

Tailoring a plasma focus as hard x-ray source for imaging

Hussain

Shafiq

Zakaullah

2010

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

“…The earlier studies on the low energy PF devices, similar to the device used in this paper, showed that the electron beam output has strong correlation with the general plasma dynamics Neog and Mohanty 2007;Zhang et al 2007). The correlation starts from the breakdown through the radial phase.…”

Section: Discussionmentioning

confidence: 57%

Post-pinch generation of electron beam in a low energy Mather-type plasma focus device

Behbahani¹,

Aghamir²

2013

J. Plasma Phys.

View full text Add to dashboard Cite

The post-pinch generation of electron beam in a low energy Mather-type plasma focus (PF) device has been investigated. A fast-calibrated Rogowski coil was used to monitor the emission of electron beam. A two-channel diode X-ray spectrometer along with suitable filters provided the records of energy spectrum of X-ray radiation. Single time-period emissions of electron beam with duration of 100 to 20 ns were recorded in the high range of the device operating pressure (0.8-2 mbar). However, in the low range regime (0.2-0.8 mbar), occurrence of single spike electron beam with duration of 150 ± 50 ns, as well as multi-emission of electrons with duration of 400 ± 50 ns, was visible. A multi-peak of tube voltage along with multi-time-period radiation of X-rays dominated by copper lines (Cuk α and Cuk β ) was noticeable in the low-pressure range. The generated electron beam during the post-pinch phase of anomalous resistances is suspected to be the main source of X-ray radiation. This can also be related to the turbulence of the plasma column during the occurrence of anomalous resistances.

show abstract

“…The plasma produced is of very high temperature (1-3 keV) and high density (>10 19 Particles/cm 3 ) [1]. The device is particularly interesting due to its special characteristic as intense pulsed sources of X-rays, ions, electrons and neutrons (deuterium filling) [2][3][4][5]. The early research was concentrated on the neutron emission [6,7] and yet in recent years, there is abrupt growth of researcher's interest in utilized plasma focus for its application in surface modification [8], ion implantation [9] and thin film deposition [10].…”

Section: Introductionmentioning

confidence: 99%

Diagnostics of ion beam generated from a Mather type plasma focus device

Lim¹,

Ngoi²,

Wong³

et al. 2014

AIP Conference Proceedings

View full text Add to dashboard Cite

Diagnostics of ion beam emission from a 3 kJ Mather-type plasma focus device have been performed for deuterium discharge at low pressure regime. Deuterium plasma focus was found to be optimum at pressure of 0.2 mbar. The energy spectrum and total number of ions per shot from the pulsed ion beam are determined by using biased ion collectors, Faraday cup, and solid state nuclear track detector CR-39. Average energy of the ion beam obtained is about 60 keV. Total number of the ions has been determined to be in the order of 10 11 per shot. Solid state nuclear track detectors (SSNTD) CR39 are employed to measure the particles at all angular direction from end on (0˚) to side on (90˚). Particle tracks are registered by SSNTD at 30˚ to 90˚, except the one at the end-on 0 ˚.

show abstract

Study on electron beam emission from a low energy plasma focus device

Cited by 33 publications

References 25 publications

Tailoring a plasma focus as hard x-ray source for imaging

Tailoring a plasma focus as hard x-ray source for imaging

Post-pinch generation of electron beam in a low energy Mather-type plasma focus device

Diagnostics of ion beam generated from a Mather type plasma focus device

Contact Info

Product

Resources

About