2004
DOI: 10.1016/j.msec.2003.09.005
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Study on electrical characteristics of organic electrophosphorescent devices based on new Ir complex

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Cited by 18 publications
(5 citation statements)
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“…In a single BPhen ET layer, electrons hop along the LUMO in BPhen. The LUMO-LUMO difference between BPhen (3.0 eV) [26] and Liq (3.1 eV) [32] is very small. Therefore, transport is more likely to be expected along their LUMOs by electron hopping [24] among the BPhen and Liq sites.…”
Section: Resultsmentioning
confidence: 94%
See 1 more Smart Citation
“…In a single BPhen ET layer, electrons hop along the LUMO in BPhen. The LUMO-LUMO difference between BPhen (3.0 eV) [26] and Liq (3.1 eV) [32] is very small. Therefore, transport is more likely to be expected along their LUMOs by electron hopping [24] among the BPhen and Liq sites.…”
Section: Resultsmentioning
confidence: 94%
“…A thin layer of 2,9-Dimethyl-4,7-diphenyl-1,10-phenanthroline (Bathocuproine BCP) is incorporated to impede holes to enter the ETL, since it possesses a highest occupied molecular orbital (HOMO) level (6.7 eV) [32]. The current density versus voltage characteristics of electron-only devices at various doping ratios of Liq to BPhen are shown in figure 3.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 1 shows the energy level diagram of the materials used in this study. Three sets of [23,24] and [25], respectively. electron-only devices with different cathodes were fabricated.…”
Section: Methodsmentioning
confidence: 99%
“…Energy level diagram of the materials used. HOMO and LUMO values of Bpy-OXD, BPhen and BCP have been taken from[23,24] and[25], respectively.…”
mentioning
confidence: 99%
“…Also, one of the important properties of host materials is to balance electron and hole transporting ability [8][9] . The host materials are generally designed by introducing a well-known carbazole unit to obtain those properties, such as CBP (N,N'-dicarbazolyl-4,4'-biphenyl) [10] . However, a carbazole unit is a good electron donor which may induce an unbalanced carrier injection and transport into the emitting layer, resulting in a limited device performance.…”
Section: Introductionmentioning
confidence: 99%